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@article{1753022,
author = {Mikšová, Romana and Jagerová, Adéla and Malinský, Petr and Harcuba, Petr and Vesely, Jozef and Holý, Václav and Kentsch, Ulrich and Macková, Anna},
article_location = {Oxford},
article_number = {February},
doi = {http://dx.doi.org/10.1016/j.vacuum.2020.109773},
keywords = {Ag-ion implantation; Yttria-stabilised zirconia; Damage accumulation; Strain relaxation; Nanoparticles},
language = {eng},
issn = {0042-207X},
journal = {Vacuum},
title = {Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation},
url = {https://doi.org/10.1016/j.vacuum.2020.109773},
volume = {184},
year = {2021}
}
TY - JOUR
ID - 1753022
AU - Mikšová, Romana - Jagerová, Adéla - Malinský, Petr - Harcuba, Petr - Vesely, Jozef - Holý, Václav - Kentsch, Ulrich - Macková, Anna
PY - 2021
TI - Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
JF - Vacuum
VL - 184
IS - February
SP - 1-11
EP - 1-11
PB - Pergamon-Elsevier Science Ltd
SN - 0042207X
KW - Ag-ion implantation
KW - Yttria-stabilised zirconia
KW - Damage accumulation
KW - Strain relaxation
KW - Nanoparticles
UR - https://doi.org/10.1016/j.vacuum.2020.109773
N2 - The paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the <110> direction than along the <100> and <111> direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS.
ER -
MIKŠOVÁ, Romana, Adéla JAGEROVÁ, Petr MALINSKÝ, Petr HARCUBA, Jozef VESELY, Václav HOLÝ, Ulrich KENTSCH a Anna MACKOVÁ. Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation. \textit{Vacuum}. Oxford: Pergamon-Elsevier Science Ltd, 2021, roč.~184, February, s.~1-11. ISSN~0042-207X. Dostupné z: https://dx.doi.org/10.1016/j.vacuum.2020.109773.
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