A Bad Day to Die Hard: Correcting the Dieharder Battery

J 2022

A Bad Day to Die Hard: Correcting the Dieharder Battery

SÝS, Marek, Ľubomír OBRÁTIL, Václav MATYÁŠ a Dušan KLINEC

Základní údaje

Originální název

A Bad Day to Die Hard: Correcting the Dieharder Battery

Autoři

SÝS, Marek (703 Slovensko, garant, domácí), Ľubomír OBRÁTIL (703 Slovensko, domácí), Václav MATYÁŠ (203 Česká republika, domácí) a Dušan KLINEC (703 Slovensko, domácí)

Vydání

Journal of Cryptology, SPRINGER, 2022, 0933-2790

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10201 Computer sciences, information science, bioinformatics

Stát vydavatele

Spojené státy

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 3.000

Kód RIV

RIV/00216224:14330/22:00119744

Organizační jednotka

Fakulta informatiky

DOI

http://dx.doi.org/10.1007/s00145-021-09414-y

UT WoS

000717978700001

Klíčová slova česky

Dieharder batéria test náhodnosti p-hodnota Kolmogorov–Smirnov test

Klíčová slova anglicky

Dieharder batéria test náhodnosti p-hodnota Kolmogorov–Smirnov test

Příznaky

Mezinárodní význam, Recenzováno

Změněno: 24. 4. 2022 14:17, Mgr. Marek Sýs, Ph.D.

Anotace

V originále

We analyze Dieharder statistical randomness tests according to accuracy and correct interpretation of their results. We used all tests, processed 8 TB of quantum-generated data, and obtained null distributions of first-level and second-level p-values. We inspected whether the p-values are uniformly distributed. The analysis showed that more than half (out of 110) of Dierharder atomic tests (test with particular setting) produce null distributions of p-values that are biased from the expected uniform one. Additional analysis of the Kolmogorov-Smirnov (KS) test showed that the key KS test is also biased. This increases the probability of false positives (in the right tail) for all Dieharder tests as KS is used to post-process their results. Moreover, 12 tests (22 atomic) produce results significantly biased from the null distribution of the KS test which may suggest problems with the implementation of these tests.

Návaznosti

GA20-03426S, projekt VaV

Název: Ověření a zlepšení bezpečnosti kryptografie eliptických křivek

Investor: Grantová agentura ČR, Ověření a zlepšení bezpečnosti kryptografie eliptických křivek

90140, velká výzkumná infrastruktura

Název: e-INFRA CZ

Citovat

SÝS, Marek, Ľubomír OBRÁTIL, Václav MATYÁŠ a Dušan KLINEC. A Bad Day to Die Hard: Correcting the Dieharder Battery. Journal of Cryptology. SPRINGER, 2022, roč. 35, č. 1, s. 1-20. ISSN 0933-2790. Dostupné z: https://dx.doi.org/10.1007/s00145-021-09414-y.

@article{1848587,
   author = {Sýs, Marek and Obrátil, Ľubomír and Matyáš, Václav and Klinec, Dušan},
   article_number = {1},
   doi = {http://dx.doi.org/10.1007/s00145-021-09414-y},
   keywords = {Dieharder batéria test náhodnosti p-hodnota Kolmogorov–Smirnov test},
   language = {eng},
   issn = {0933-2790},
   journal = {Journal of Cryptology},
   title = {A Bad Day to Die Hard: Correcting the Dieharder Battery},
   url = {https://link.springer.com/content/pdf/10.1007/s00145-021-09414-y.pdf},
   volume = {35},
   year = {2022}
}

TY  - JOUR
ID  - 1848587
AU  - Sýs, Marek - Obrátil, Ľubomír - Matyáš, Václav - Klinec, Dušan
PY  - 2022
TI  - A Bad Day to Die Hard: Correcting the Dieharder Battery
JF  - Journal of Cryptology
VL  - 35
IS  - 1
SP  - 1-20
EP  - 1-20
PB  - SPRINGER
SN  - 09332790
KW  - Dieharder batéria test náhodnosti p-hodnota Kolmogorov–Smirnov test
UR  - https://link.springer.com/content/pdf/10.1007/s00145-021-09414-y.pdf
N2  - We analyze Dieharder statistical randomness tests according to accuracy and correct interpretation of their results. We used all tests, processed 8 TB of quantum-generated data, and obtained null distributions of first-level and second-level p-values. We inspected whether the p-values are uniformly distributed. The analysis showed that more than half (out of 110) of Dierharder atomic tests (test with particular setting) produce null distributions of p-values that are biased from the expected uniform one. Additional analysis of the Kolmogorov-Smirnov (KS) test showed that the key KS test is also biased. This increases the probability of false positives (in the right tail) for all Dieharder tests as KS is used to post-process their results. Moreover, 12 tests (22 atomic) produce results significantly biased from the null distribution of the KS test which may suggest problems with the implementation of these tests.
ER  -

SÝS, Marek, Ľubomír OBRÁTIL, Václav MATYÁŠ a Dušan KLINEC. A Bad Day to Die Hard: Correcting the Dieharder Battery. \textit{Journal of Cryptology}. SPRINGER, 2022, roč.~35, č.~1, s.~1-20. ISSN~0933-2790. Dostupné z: https://dx.doi.org/10.1007/s00145-021-09414-y.

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