HUMLÍČEK, Josef, K. KAMARAS a J. KIRCHER. Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films. Thin Solid Films. UK Oxford: Elsevier science, 1993, roč. 234, č. 1, s. 518-521. ISSN 0040-6090. |
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@article{196773, author = {Humlíček, Josef and Kamaras, K. and Kircher, J. and Habermeier, M. and Cardona, M.}, article_location = {UK Oxford}, article_number = {1}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films}, volume = {234}, year = {1993} }
TY - JOUR ID - 196773 AU - Humlíček, Josef - Kamaras, K. - Kircher, J. - Habermeier, M. - Cardona, M. PY - 1993 TI - Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films JF - Thin Solid Films VL - 234 IS - 1 SP - 518 EP - 518 PB - Elsevier science SN - 00406090 ER -
HUMLÍČEK, Josef, K. KAMARAS a J. KIRCHER. Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films. \textit{Thin Solid Films}. UK Oxford: Elsevier science, 1993, roč.~234, č.~1, s.~518-521. ISSN~0040-6090.
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