J 1994

X-ray characterization of semiconductor surfaces and interfaces

PLOTZ, W. and Václav HOLÝ

Basic information

Original name

X-ray characterization of semiconductor surfaces and interfaces

Authors

PLOTZ, W. and Václav HOLÝ

Edition

J. Phys. III France 4, 1994

Other information

Language

English

Type of outcome

Article in a journal

Field of Study

10302 Condensed matter physics

Country of publisher

France

Confidentiality degree

is not subject to a state or trade secret

RIV identification code

RIV/00216224:14310/94:00000015

Organization unit

Faculty of Science

UT WoS

A1994PH37300008
Changed: 18/4/2000 10:31, prof. RNDr. Václav Holý, CSc.

Links

MSM 143100002, plan (intention)
Name: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical properties of new materials and layered structures