BOCHNÍČEK, Zdeněk, Václav HOLÝ, G. WOLF, H. STANZL a J. GEBHARDT. High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures. Journal of Applied Physics. 1995, roč. 78, č. 2, s. 862-867. ISSN 0021-8979. |
Další formáty:
BibTeX
LaTeX
RIS
@article{197231, author = {Bochníček, Zdeněk and Holý, Václav and Wolf, G. and Stanzl, H. and Gebhardt, J.}, article_number = {2}, language = {eng}, issn = {0021-8979}, journal = {Journal of Applied Physics}, title = {High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures.}, volume = {78}, year = {1995} }
TY - JOUR ID - 197231 AU - Bochníček, Zdeněk - Holý, Václav - Wolf, G. - Stanzl, H. - Gebhardt, J. PY - 1995 TI - High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures. JF - Journal of Applied Physics VL - 78 IS - 2 SP - 862 EP - 862 SN - 00218979 ER -
BOCHNÍČEK, Zdeněk, Václav HOLÝ, G. WOLF, H. STANZL a J. GEBHARDT. High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures. \textit{Journal of Applied Physics}. 1995, roč.~78, č.~2, s.~862-867. ISSN~0021-8979.
|