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@article{197247,
author = {Jergel, M. and Holý, Václav},
article_number = {-},
language = {eng},
issn = {0022-3727},
journal = {J. Phys. D: Appl. Phys.},
title = {Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction},
volume = {28},
year = {1995}
}
TY - JOUR
ID - 197247
AU - Jergel, M. - Holý, Václav
PY - 1995
TI - Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction
JF - J. Phys. D: Appl. Phys.
VL - 28
IS - -
SP - 258
EP - 258
SN - 00223727
ER -
JERGEL, M. a Václav HOLÝ. Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction. \textit{J. Phys. D: Appl. Phys.}. 1995, roč.~28, -, s.~258-262. ISSN~0022-3727.
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