1995
X-ray diffraction on Fibonacci superlattices
MIKULÍK, Petr, Václav HOLÝ a Josef KUBĚNAZákladní údaje
Originální název
X-ray diffraction on Fibonacci superlattices
Autoři
MIKULÍK, Petr (203 Česká republika, garant), Václav HOLÝ (203 Česká republika) a Josef KUBĚNA (203 Česká republika)
Vydání
Acta Crystallographica A, 1995
Další údaje
Jazyk
angličtina
Typ výsledku
Článek v odborném periodiku
Obor
10302 Condensed matter physics
Stát vydavatele
Velká Británie a Severní Irsko
Utajení
není předmětem státního či obchodního tajemství
Odkazy
Kód RIV
RIV/00216224:14310/95:00000346
Organizační jednotka
Přírodovědecká fakulta
Klíčová slova anglicky
x-ray diffraction; quasicrystals; fibonacci; superlattices
Štítky
Příznaky
Mezinárodní význam, Recenzováno
Změněno: 12. 2. 2007 18:40, doc. RNDr. Petr Mikulík, Ph.D.
V originále
The exact diffraction curve of the Fibonacci superlattice is calculated using the semikinematical approximation of dynamical X-ray diffraction. The properties of the discrete Fourier transform of quasiperiodically arranged layers are employed to get explicit approximate formula for the diffracted intensity and for the angular positions of peaks. The exact and approximate curves were compared by a numerical simulation and a good agreement was found. The measurement of diffraction curve was performed on the generalized Fibonacci superlattice built by stacked Fibonacci generations. This superlattice belongs to the same class of local isomorphism as the Fibonacci superlattice if both are infinitely thick. The explicit approximate formulae enabled to fit the structural parameters of the superlattice even in the low resolution experimental setup when the fit of the whole measured diffraction curve was not possible.
Česky
The exact diffraction curve of the Fibonacci superlattice is calculated using the semikinematical approximation of dynamical X-ray diffraction. The properties of the discrete Fourier transform of quasiperiodically arranged layers are employed to get explicit approximate formula for the diffracted intensity and for the angular positions of peaks. The exact and approximate curves were compared by a numerical simulation and a good agreement was found. The measurement of diffraction curve was performed on the generalized Fibonacci superlattice built by stacked Fibonacci generations. This superlattice belongs to the same class of local isomorphism as the Fibonacci superlattice if both are infinitely thick. The explicit approximate formulae enabled to fit the structural parameters of the superlattice even in the low resolution experimental setup when the fit of the whole measured diffraction curve was not possible.
Návaznosti
MSM 143100002, záměr |
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