1998
Oblique roughness replication in strained SiGe/Si multilayers
HOLÝ, Václav; A.A. DARHUBER; J. STANGL; G. BAUER; J. NUETZEL et. al.Basic information
Original name
Oblique roughness replication in strained SiGe/Si multilayers
Authors
HOLÝ, Václav; A.A. DARHUBER; J. STANGL; G. BAUER; J. NUETZEL and G. ABSTREITER
Edition
Physical Review B, USA, The American Physical Society, 1998, 0163-1829
Other information
Language
English
Type of outcome
Article in a journal
Field of Study
10302 Condensed matter physics
Country of publisher
United States of America
Confidentiality degree
is not subject to a state or trade secret
Impact factor
Impact factor: 2.842
RIV identification code
RIV/00216224:14310/98:00000758
Organization unit
Faculty of Science
UT WoS
000073761500094
Changed: 20/3/2000 06:49, prof. RNDr. Václav Holý, CSc.
Links
| MSM 143100002, plan (intention) |
|