GRIM, Jan, Václav HOLÝ, Josef KUBĚNA, J. STANGL, A.A. DARHUBER, S. ZERLAUTH, F. SCHÄFFLER and G. BAUER. Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. Semicond. Sci. Technol. Velká Britanie: IOP Publishing Ltd, 1999, 32(1999), -, p. A216, 4 pp. ISSN 0268-1242. |
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@article{216011, author = {Grim, Jan and Holý, Václav and Kuběna, Josef and Stangl, J. and Darhuber, A.A. and Zerlauth, S. and Schäffler, F. and Bauer, G.}, article_location = {Velká Britanie}, article_number = {-}, language = {eng}, issn = {0268-1242}, journal = {Semicond. Sci. Technol.}, title = {Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers}, volume = {32(1999)}, year = {1999} }
TY - JOUR ID - 216011 AU - Grim, Jan - Holý, Václav - Kuběna, Josef - Stangl, J. - Darhuber, A.A. - Zerlauth, S. - Schäffler, F. - Bauer, G. PY - 1999 TI - Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers JF - Semicond. Sci. Technol. VL - 32(1999) IS - - SP - A216 EP - A216 PB - IOP Publishing Ltd SN - 02681242 ER -
GRIM, Jan, Václav HOLÝ, Josef KUBĚNA, J. STANGL, A.A. DARHUBER, S. ZERLAUTH, F. SCHÄFFLER and G. BAUER. Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. \textit{Semicond. Sci. Technol.}. Velká Britanie: IOP Publishing Ltd, 1999, 32(1999), -, p.~A216, 4 pp. ISSN~0268-1242.
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