| GRIM, Jan, Václav HOLÝ, Josef KUBĚNA, A.A. DARHUBER, S. ZERLAUTH a G. BAUER. X-ray reflection from self-organized interfaces in an SiGe/Si multilayer. Semicond. Sci. Technol. Velká Britanie: IOP Publishing Ltd, 1999, roč. 14(1999), -, s. 32-40. ISSN 0268-1242. |
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@article{216291,
author = {Grim, Jan and Holý, Václav and Kuběna, Josef and Darhuber, A.A. and Zerlauth, S. and Bauer, G.},
article_location = {Velká Britanie},
article_number = {-},
language = {eng},
issn = {0268-1242},
journal = {Semicond. Sci. Technol.},
title = {X-ray reflection from self-organized interfaces in an SiGe/Si multilayer},
volume = {14(1999)},
year = {1999}
}
TY - JOUR
ID - 216291
AU - Grim, Jan - Holý, Václav - Kuběna, Josef - Darhuber, A.A. - Zerlauth, S. - Bauer, G.
PY - 1999
TI - X-ray reflection from self-organized interfaces in an SiGe/Si multilayer
JF - Semicond. Sci. Technol.
VL - 14(1999)
IS - -
SP - 32
EP - 32
PB - IOP Publishing Ltd
SN - 02681242
ER -
GRIM, Jan, Václav HOLÝ, Josef KUBĚNA, A.A. DARHUBER, S. ZERLAUTH a G. BAUER. X-ray reflection from self-organized interfaces in an SiGe/Si multilayer. \textit{Semicond. Sci. Technol.}. Velká Britanie: IOP Publishing Ltd, 1999, roč.~14(1999), -, s.~32-40. ISSN~0268-1242.
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