Multi-Wavelength Angle-Resolved Scattering of Randomly Rough
Surfaces Based on the Scalar Diffraction Theory

J 2023

Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory

ŠULC, Václav; Jiří VOHÁNKA; Ivan OHLÍDAL; Petr KLAPETEK; Miloslav OHLÍDAL et al.

Základní údaje

Originální název

Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory

Autoři

ŠULC, Václav; Jiří VOHÁNKA; Ivan OHLÍDAL; Petr KLAPETEK; Miloslav OHLÍDAL; Nupinder Jeet KAUR a František VIŽĎA

Vydání

Coatings, MDPI, 2023, 2079-6412

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10306 Optics

Stát vydavatele

Švýcarsko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 2.900

Označené pro přenos do RIV

Ano

Kód RIV

RIV/00216224:14310/23:00132741

Organizační jednotka

Přírodovědecká fakulta

Klíčová slova anglicky

roughness; scalar diffraction theory; angle-resolved scattering

Štítky

14312030, rivok

Příznaky

Mezinárodní význam, Recenzováno

Změněno: 21. 2. 2024 11:03, Mgr. Marie Novosadová Šípková, DiS.

Anotace

V originále

Angle-resolved scattering was measured for four samples of silicon exhibiting different surface roughnesses. The measurements were performed for three wavelengths: 457.9 nm, 514.5 nm, and 647.1 nm. Three approaches were used to evaluate the experimental data. The first approach corresponds to the exact formula derived using the scalar diffraction theory. This formula is quite complicated, and numerical methods must be used for its evaluation. For this reason, another two approaches representing approximations by much simpler formulae were considered. The use of several wavelengths allowed us not only to recover the power spectral density function in a limited interval of spatial frequencies but also to determine the total rms values of the heights, which represent the quantity of roughness for all spatial frequencies. The possibility of recovering the total rms values of the heights using the multi-wavelength approach is the most important result of this work. The results obtained from the scattering experiment and atomic force microscopy are compared.

Návaznosti

90239, velká výzkumná infrastruktura

Název: CEPLANT II

Citovat

ŠULC, Václav; Jiří VOHÁNKA; Ivan OHLÍDAL; Petr KLAPETEK; Miloslav OHLÍDAL; Nupinder Jeet KAUR a František VIŽĎA. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory. Coatings. MDPI, 2023, roč. 13, č. 11, s. 1-15. ISSN 2079-6412. Dostupné z: https://doi.org/10.3390/coatings13111853.

@article{2355407,
   author = {Šulc, Václav and Vohánka, Jiří and Ohlídal, Ivan and Klapetek, Petr and Ohlídal, Miloslav and Kaur, Nupinder Jeet and Vižďa, František},
   article_number = {11},
   doi = {https://doi.org/10.3390/coatings13111853},
   keywords = {roughness; scalar diffraction theory; angle-resolved scattering},
   language = {eng},
   issn = {2079-6412},
   journal = {Coatings},
   title = {Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory},
   url = {https://doi.org/10.3390/coatings13111853},
   volume = {13},
   year = {2023}
}

TY  - JOUR
ID  - 2355407
AU  - Šulc, Václav - Vohánka, Jiří - Ohlídal, Ivan - Klapetek, Petr - Ohlídal, Miloslav - Kaur, Nupinder Jeet - Vižďa, František
PY  - 2023
TI  - Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory
JF  - Coatings
VL  - 13
IS  - 11
SP  - 1-15
EP  - 1-15
PB  - MDPI
SN  - 20796412
KW  - roughness
KW  - scalar diffraction theory
KW  - angle-resolved scattering
UR  - https://doi.org/10.3390/coatings13111853
N2  - Angle-resolved scattering was measured for four samples of silicon exhibiting different surface roughnesses. The measurements were performed for three wavelengths: 457.9 nm, 514.5 nm, and 647.1 nm. Three approaches were used to evaluate the experimental data. The first approach corresponds to the exact formula derived using the scalar diffraction theory. This formula is quite complicated, and numerical methods must be used for its evaluation. For this reason, another two approaches representing approximations by much simpler formulae were considered. The use of several wavelengths allowed us not only to recover the power spectral density function in a limited interval of spatial frequencies but also to determine the total rms values of the heights, which represent the quantity of roughness for all spatial frequencies. The possibility of recovering the total rms values of the heights using the multi-wavelength approach is the most important result of this work. The results obtained from the scattering experiment and atomic force microscopy are compared.
ER  -

ŠULC, Václav; Jiří VOHÁNKA; Ivan OHLÍDAL; Petr KLAPETEK; Miloslav OHLÍDAL; Nupinder Jeet KAUR a František VIŽĎA. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory. \textit{Coatings}. MDPI, 2023, roč.~13, č.~11, s.~1-15. ISSN~2079-6412. Dostupné z: https://doi.org/10.3390/coatings13111853.

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