2024
Floating potential probes for process control during reactive magnetron sputtering
VAN BEVER, J.; Petr VAŠINA; Richard Gaetan Paul DREVET; K. STRIJCKMANS; D. DEPLA et al.Základní údaje
Originální název
Floating potential probes for process control during reactive magnetron sputtering
Autoři
VAN BEVER, J.; Petr VAŠINA; Richard Gaetan Paul DREVET; K. STRIJCKMANS a D. DEPLA
Vydání
Surface and Coatings Technology, Elsevier B.V. 2024, 0257-8972
Další údaje
Jazyk
angličtina
Typ výsledku
Článek v odborném periodiku
Obor
10305 Fluids and plasma physics
Stát vydavatele
Švýcarsko
Utajení
není předmětem státního či obchodního tajemství
Odkazy
Impakt faktor
Impact factor: 6.100
Označené pro přenos do RIV
Ano
Kód RIV
RIV/00216224:14310/24:00137338
Organizační jednotka
Přírodovědecká fakulta
UT WoS
EID Scopus
Klíčová slova anglicky
Reactive magnetron sputtering; Process control; Floating potential; Plasma potential
Příznaky
Mezinárodní význam, Recenzováno
Změněno: 9. 7. 2025 13:28, Mgr. Marie Novosadová Šípková, DiS.
Anotace
V originále
Long term deposition of aluminum oxide by reactive magnetron sputtering results in a drift of the discharge voltage. A similar drift of the floating potential is observed. The latter observation is further investigated and it is shown that the change of the floating potential can be linked to a change of the electric properties of the vacuum chamber walls. Optimization of the floating potential probe is performed to use the difference between the discharge voltage and the floating potential as a parameter for process control. The best results were obtained with a planar probe sufficiently far positioned opposite to the magnetron, and close enough to the chamber wall facing the magnetron. This choice can be understood in terms of the ability of the probe to sense the discharge while being protected from deposition. The usage of the aforementioned difference to control the process is demonstrated with the measurement of process curves, more specifically IV-characteristics and hysteresis experiments. The shown reproducibility of these measurements opens a pathway for more precise quantification of reactive sputter deposition simulations and enhanced process control.
Návaznosti
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