2000
Analysis of thin films by optical multi-sample methods
FRANTA, Daniel a Ivan OHLÍDALZákladní údaje
Originální název
Analysis of thin films by optical multi-sample methods
Autoři
Vydání
Acta Physica Slovaca, Bratislava, Institute of Physics, SAS, 2000, 0323-0465
Další údaje
Jazyk
angličtina
Typ výsledku
Článek v odborném periodiku
Obor
10302 Condensed matter physics
Stát vydavatele
Slovensko
Utajení
není předmětem státního či obchodního tajemství
Odkazy
Impakt faktor
Impact factor: 0.465
Označené pro přenos do RIV
Ano
Kód RIV
RIV/00216224:14310/00:00002317
Organizační jednotka
Přírodovědecká fakulta
UT WoS
Změněno: 22. 12. 2003 00:38, Mgr. Daniel Franta, Ph.D.
Anotace
V originále
In this paper a brief review of the optical methods based on the simultaneous interpretation of the different optical experimental data obtained for thin film systems is presented. These methods are known as the multi-sample methods. It is shown that these optical multi-sample methods are very useful for analyzing many thin film systems. In particular it is illustrated that selected optical multi-sample methods are powerful for studying the following problems: investigations of growing the native oxide layers on the semiconductor surfaces; suppression of the influence of the transition interlayers between the substrates and thin films and determination of the optical constants of bulk materials. Concrete experimental examples demonstrating the foregoing statements are presented in this paper as well.
Návaznosti
| GA202/98/0988, projekt VaV |
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| GV106/96/K245, projekt VaV |
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| VS96084, projekt VaV |
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