Calculation of the optical quantities characterizing
inhomogeneous thin film using a new mathematical procedure
based on the matrix formalism and Drude approximation

D 2001

Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation

FRANTA, Daniel a Ivan OHLÍDAL

Základní údaje

Originální název

Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation

Autoři

FRANTA, Daniel a Ivan OHLÍDAL

Vydání

Bellingham, Washington, USA, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, od s. 207-212, 6 s. 2001

Nakladatel

SPIE - The International Society for Optical Engineering

Další údaje

Jazyk

angličtina

Typ výsledku

Stať ve sborníku

Obor

10306 Optics

Stát vydavatele

Spojené státy

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Označené pro přenos do RIV

Ano

Kód RIV

RIV/00216224:14310/01:00004153

Organizační jednotka

Přírodovědecká fakulta

ISBN

0-8194-4047-7

Klíčová slova anglicky

inhomogeneous thin films; optical quantities; matrix formalism; Drude approximation

Štítky

Drude approximation, inhomogeneous thin films, matrix formalism, optical quantities

Změněno: 25. 12. 2003 00:14, Mgr. Daniel Franta, Ph.D.

Anotace

V originále

In this contribution a new mathematical procedure enabling us to calculate the optical quantities of the inhomogeneous thin films such as reflectance, transmittance and ellipsometric parameters will be described. This procedure is based on combining the known matrix formalism and Drude approximation. The inhomogeneous thin films is replaced by a multilayer system containing the thin films with a linear profiles of the dielectric function and different thicknesses. Every individual film of the multilayer system is described by the matrix corresponding to the Drude approximation. Using this procedure one can construct an efficient algorithm allowing to calculate the values of the optical quantities of the inhomogeneous thin films exhibiting great gradients of the refractive index profiles.

Návaznosti

GA203/00/0085, projekt VaV

Název: Optické vlastnosti skel a amorfních tenkých vrstev sulfidů a selenidů

Investor: Grantová agentura ČR, Optické vlastnosti skel a amorfních tenkých vrstev sulfidů a selenidů

Citovat

FRANTA, Daniel a Ivan OHLÍDAL. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001, s. 207-212. ISBN 0-8194-4047-7.

@inproceedings{360731,
   author = {Franta, Daniel and Ohlídal, Ivan},
   address = {Bellingham, Washington, USA},
   booktitle = {12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics},
   keywords = {inhomogeneous thin films; optical quantities; matrix formalism; Drude approximation},
   language = {eng},
   location = {Bellingham, Washington, USA},
   isbn = {0-8194-4047-7},
   pages = {207-212},
   publisher = {SPIE - The International Society for Optical Engineering},
   title = {Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation},
   url = {http://hydra.physics.muni.cz/~franta/bib/SPIE4356_207.html},
   year = {2001}
}

TY  - CONF
ID  - 360731
AU  - Franta, Daniel - Ohlídal, Ivan
PY  - 2001
TI  - Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation
PB  - SPIE - The International Society for Optical Engineering
CY  - Bellingham, Washington, USA
SN  - 0819440477
KW  - inhomogeneous thin films
KW  - optical quantities
KW  - matrix formalism
KW  - Drude approximation
UR  - http://hydra.physics.muni.cz/~franta/bib/SPIE4356_207.html
N2  - In this contribution a new mathematical procedure enabling us to calculate the optical quantities of the inhomogeneous thin films such as reflectance, transmittance and ellipsometric parameters will be described. This procedure is based on combining the known matrix formalism and Drude approximation. The inhomogeneous thin films is replaced by a multilayer system containing the thin films with a linear profiles of the dielectric function and different thicknesses. Every individual film of the multilayer system is described by the matrix corresponding to the Drude approximation. Using this procedure one can construct an efficient algorithm allowing to calculate the values of the optical quantities of the inhomogeneous thin films exhibiting great gradients of the refractive index profiles.
ER  -

FRANTA, Daniel a Ivan OHLÍDAL. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation. In \textit{12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics}. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001, s.~207-212. ISBN~0-8194-4047-7.

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