OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL a Karel NAVRÁTIL. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics. USA: Optical Society of America, 2001, roč. 40, č. 31, s. 5711-5717. ISSN 0003-6935. |
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@article{378151, author = {Ohlídal, Ivan and Franta, Daniel and Ohlídal, Miloslav and Navrátil, Karel}, article_location = {USA}, article_number = {31}, keywords = {REFLECTION; CONSTANTS; THICKNESS; SILICON; SYSTEM}, language = {eng}, issn = {0003-6935}, journal = {Applied Optics}, title = {Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances}, url = {http://hydra.physics.muni.cz/~franta/bib/AO40_5711.html}, volume = {40}, year = {2001} }
TY - JOUR ID - 378151 AU - Ohlídal, Ivan - Franta, Daniel - Ohlídal, Miloslav - Navrátil, Karel PY - 2001 TI - Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances JF - Applied Optics VL - 40 IS - 31 SP - 5711 EP - 5711 PB - Optical Society of America SN - 00036935 KW - REFLECTION KW - CONSTANTS KW - THICKNESS KW - SILICON KW - SYSTEM UR - http://hydra.physics.muni.cz/~franta/bib/AO40_5711.html N2 - In this contribution a new efficient modification of a method that enables us to perform the optical characterization of nonabsorbing and weakly absorbing thin films without using the absolute values of the reflectances measured is presented. Namely, this modification is based on determining the values of the wavelengths corresponding to touching the spectral dependences of the reflectances of the studied films measured for several angles of incidence with the envelopes of maxima and minima of these spectral dependences. By means of combining the explicit formulas containing the wavelengths mentioned and the suitable iteration procedure one can evaluate the values of the thicknesses and spectral dependences of the refractive indices of the films analyzed in reliable and precise ways. ER -
OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL a Karel NAVRÁTIL. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. \textit{Applied Optics}. USA: Optical Society of America, 2001, roč.~40, č.~31, s.~5711-5717. ISSN~0003-6935.
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