KUBA, Petr, Pavel BRAZDIL, Carlos SOARES a Adam WOZNICA. Exploiting Sampling and Meta-learning for Parameter Setting for Support Vector Machines. In Proc. of Workshop Learning and Data Mining associated with Iberamia 2002, VIII Iberoamerican Conference on Artificial Intellignce. Sevilla (Spain): University of Sevilla, 2002, s. 209-216. |
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@inproceedings{406638, author = {Kuba, Petr and Brazdil, Pavel and Soares, Carlos and Woznica, Adam}, address = {Sevilla (Spain)}, booktitle = {Proc. of Workshop Learning and Data Mining associated with Iberamia 2002, VIII Iberoamerican Conference on Artificial Intellignce}, keywords = {SVM; Meta-learning; parameter setting}, language = {eng}, location = {Sevilla (Spain)}, pages = {209-216}, publisher = {University of Sevilla}, title = {Exploiting Sampling and Meta-learning for Parameter Setting for Support Vector Machines}, year = {2002} }
TY - JOUR ID - 406638 AU - Kuba, Petr - Brazdil, Pavel - Soares, Carlos - Woznica, Adam PY - 2002 TI - Exploiting Sampling and Meta-learning for Parameter Setting for Support Vector Machines PB - University of Sevilla CY - Sevilla (Spain) KW - SVM KW - Meta-learning KW - parameter setting N2 - It is a known fact that good parameter settings affect the performance of many machine learning algorithms. Support Vector Machines (SVM) and Neural Networks are particularly affected. In this paper, we concentrate on SVM and discuss some ways to set its parameters. The first approach uses small samples, while the second one exploits meta-learning and past results. Both methods have been thoroughly evaluated. We show that both approaches enable us to obtain quite good results with significant savings in experimentation time. ER -
KUBA, Petr, Pavel BRAZDIL, Carlos SOARES a Adam WOZNICA. Exploiting Sampling and Meta-learning for Parameter Setting for Support Vector Machines. In \textit{Proc. of Workshop Learning and Data Mining associated with Iberamia 2002, VIII Iberoamerican Conference on Artificial Intellignce}. Sevilla (Spain): University of Sevilla, 2002, s.~209-216.
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