| SLÁDEK, Petr, Pavel SŤAHEL a Jiří ŠŤASTNÝ. Modification of the optical parameters of silicon thin films due to light scattering. Journal of Non-Crystalline Solids. Nizozemsko: Elsevier Science B.V., 2002, roč. 2002, 299-302, s. 295-299. ISSN 0022-3093. Dostupné z: https://dx.doi.org/10.1016/S0022-3093(01)00952-8. |
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@article{407593,
author = {Sládek, Petr and Sťahel, Pavel and Šťastný, Jiří},
article_location = {Nizozemsko},
article_number = {299-302},
doi = {http://dx.doi.org/10.1016/S0022-3093(01)00952-8},
keywords = {silicon thin films; absorption coefficient; light sacttering},
language = {eng},
issn = {0022-3093},
journal = {Journal of Non-Crystalline Solids},
title = {Modification of the optical parameters of silicon thin films due to light scattering},
volume = {2002},
year = {2002}
}
TY - JOUR
ID - 407593
AU - Sládek, Petr - Sťahel, Pavel - Šťastný, Jiří
PY - 2002
TI - Modification of the optical parameters of silicon thin films due to light scattering
JF - Journal of Non-Crystalline Solids
VL - 2002
IS - 299-302
SP - 295-299
EP - 295-299
PB - Elsevier Science B.V.
SN - 00223093
KW - silicon thin films
KW - absorption coefficient
KW - light sacttering
N2 - The enhanced light absorption observed in microcrystalline and polymorphous hydrogenated silicon films may partly be due to light scattering. To estimate the importance of this phenomenon. we used the new 'photocurrent induced by light scattering' method. The exciting beam is impinging on the sample outside the inter-electrode region: by changing the position of the exciting light spot and the photon energy. it is possible to estimate the light scattering effects. We applied this method to films of different materials and checked our conclusions by using the modified constant photocurrent method.
ER -
SLÁDEK, Petr, Pavel SŤAHEL a Jiří ŠŤASTNÝ. Modification of the optical parameters of silicon thin films due to light scattering. \textit{Journal of Non-Crystalline Solids}. Nizozemsko: Elsevier Science B.V., 2002, roč.~2002, 299-302, s.~295-299. ISSN~0022-3093. Dostupné z: https://dx.doi.org/10.1016/S0022-3093(01)00952-8.
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