| KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 3, s. 223-230. ISSN 0323-0465. |
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@article{489711,
author = {Klapetek, Petr and Ohlídal, Ivan and Franta, Daniel and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut},
article_location = {Bratislava},
article_number = {3},
keywords = {OPTICAL METHODS; THIN-FILMS; GOLD},
language = {eng},
issn = {0323-0465},
journal = {Acta Physica Slovaca},
title = {Atomic force microscopy characterization of ZnTe epitaxial films},
url = {http://hydra.physics.muni.cz/~franta/bib/APS53_223.html},
volume = {53},
year = {2003}
}
TY - JOUR
ID - 489711
AU - Klapetek, Petr - Ohlídal, Ivan - Franta, Daniel - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut
PY - 2003
TI - Atomic force microscopy characterization of ZnTe epitaxial films
JF - Acta Physica Slovaca
VL - 53
IS - 3
SP - 223-230
EP - 223-230
PB - Institute of Physics, SAS
SN - 03230465
KW - OPTICAL METHODS
KW - THIN-FILMS
KW - GOLD
UR - http://hydra.physics.muni.cz/~franta/bib/APS53_223.html
N2 - In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.
ER -
KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. \textit{Acta Physica Slovaca}. Bratislava: Institute of Physics, SAS, 2003, roč.~53, č.~3, s.~223-230. ISSN~0323-0465.
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