BERNHARD, Christian, Josef HUMLÍČEK a Bernhard KEIMER. Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors. Thin Solid Films. Oxford: Elsevier, 2004, roč. 455-456, č. 1, s. 143-149. ISSN 0040-6090. |
Další formáty:
BibTeX
LaTeX
RIS
@article{555797, author = {Bernhard, Christian and Humlíček, Josef and Keimer, Bernhard}, article_location = {Oxford}, article_number = {1}, keywords = {Superconductors; Dielectric; Ellipsometer}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors}, volume = {455-456}, year = {2004} }
TY - JOUR ID - 555797 AU - Bernhard, Christian - Humlíček, Josef - Keimer, Bernhard PY - 2004 TI - Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors JF - Thin Solid Films VL - 455-456 IS - 1 SP - 143-149 EP - 143-149 PB - Elsevier SN - 00406090 KW - Superconductors KW - Dielectric KW - Ellipsometer N2 - We describe the setup of an ellipsometer for the far- to mid-infrared (FIR-MIR) spectral range that is used in combination with a Fourier-transform infrared (FTIR) spectrometer and a synchrotron light source.We present the outline of the ellipsometer and discuss how it has been optimized in order to perform accurate ellipsometric measurements on relatively small single crystals of the cuprate high-T superconductors (HTSC) and other oxide based compounds with strongly correlated charge carriers. We present ellipsometric spectra for the HTSC compounds BiSrCaCuO and YBaCuO. ER -
BERNHARD, Christian, Josef HUMLÍČEK a Bernhard KEIMER. Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors. \textit{Thin Solid Films}. Oxford: Elsevier, 2004, roč.~455-456, č.~1, s.~143-149. ISSN~0040-6090.
|