Další formáty:
BibTeX
LaTeX
RIS
@inproceedings{566412, author = {Štoudek, Richard and Humlíček, Josef}, address = {Praha, Česká republika}, booktitle = {WDS'04 Proceedings of Contributed Papers}, keywords = {Infrared; Silicon; Oxygen; Precipitates}, language = {eng}, location = {Praha, Česká republika}, isbn = {80-86732-32-0}, pages = {475-479}, publisher = {MATFYZPRESS}, title = {Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon}, year = {2004} }
TY - JOUR ID - 566412 AU - Štoudek, Richard - Humlíček, Josef PY - 2004 TI - Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon PB - MATFYZPRESS CY - Praha, Česká republika SN - 8086732320 KW - Infrared KW - Silicon KW - Oxygen KW - Precipitates N2 - We have analysed infrared transmittance spectra of Czochralski silicon. Using measurements at liquid nitrogen temperature we have identified the contribution of oxygen precipitates. The continuum theory of average dielectric constant has been used to determine the shape and volume fraction of these particles. ER -
ŠTOUDEK, Richard a Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon. In \textit{WDS'04 Proceedings of Contributed Papers}. Praha, Česká republika: MATFYZPRESS, 2004, s.~475-479, 4 s. ISBN~80-86732-32-0.
|