| ANDREEV, A., R. RESEL, M.D. SMILGIES, H. HOPPE, G. MATT, H. SITTER, N. S. SARICIFTCI, D. MEISSNER, H. PLANK a O. ZRZAVECKA. Oriented organic semiconductor thin films. Synthetic Metals. Elsevier, 2003, roč. 138/2003, 1-2, s. 59-63. ISSN 0379-6779. |
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@article{567120,
author = {Andreev, A. and Resel, R. and Smilgies, M.D. and Hoppe, H. and Matt, G. and Sitter, H. and Sariciftci, N. S. and Meissner, D. and Plank, H. and Zrzavecka, O.},
article_number = {1-2},
keywords = {Organic epitaxy; Crystalline thin films; Atomic force microscopy; X-ray diffraction},
language = {eng},
issn = {0379-6779},
journal = {Synthetic Metals},
title = {Oriented organic semiconductor thin films},
volume = {138/2003},
year = {2003}
}
TY - JOUR
ID - 567120
AU - Andreev, A. - Resel, R. - Smilgies, M.D. - Hoppe, H. - Matt, G. - Sitter, H. - Sariciftci, N. S. - Meissner, D. - Plank, H. - Zrzavecka, O.
PY - 2003
TI - Oriented organic semiconductor thin films
JF - Synthetic Metals
VL - 138/2003
IS - 1-2
SP - 59-63
EP - 59-63
PB - Elsevier
SN - 03796779
KW - Organic epitaxy
KW - Crystalline thin films
KW - Atomic force microscopy
KW - X-ray diffraction
N2 - In this part of our investigations, we mainly use atomic force microscopy to study the growth of para-sexiphenyl (PSP) films on mica. It is shown that self-organization of PSP molecules occurs during the deposition controlled by the substrate temperature and deposition time. In addition, X-ray diffraction (XRD) measurements were performed using synchrotron radiation. They confirmed the very high crystalline quality of the grown films.
ER -
ANDREEV, A., R. RESEL, M.D. SMILGIES, H. HOPPE, G. MATT, H. SITTER, N. S. SARICIFTCI, D. MEISSNER, H. PLANK a O. ZRZAVECKA. Oriented organic semiconductor thin films. \textit{Synthetic Metals}. Elsevier, 2003, roč.~138/2003, 1-2, s.~59-63. ISSN~0379-6779.
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