MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO a Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SIGE MULTILAYERS AND CASCADE STRUCTURES. In XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging. Karlsruhe: Forchungszentrum Karlsruhe, 2006, s. 124. |
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@inproceedings{710322, author = {Meduňa, Mojmír and Novák, Jiří and Holý, Václav and Bauer, Günther and Falub, Claudiu and Tsujino, Soichiro and Grützmacher, Detlev}, address = {Karlsruhe}, booktitle = {XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging}, keywords = {interdiffusion; x-ray diffraction; thin films}, language = {eng}, location = {Karlsruhe}, pages = {124-124}, publisher = {Forchungszentrum Karlsruhe}, title = {IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SIGE MULTILAYERS AND CASCADE STRUCTURES}, year = {2006} }
TY - JOUR ID - 710322 AU - Meduňa, Mojmír - Novák, Jiří - Holý, Václav - Bauer, Günther - Falub, Claudiu - Tsujino, Soichiro - Grützmacher, Detlev PY - 2006 TI - IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SIGE MULTILAYERS AND CASCADE STRUCTURES PB - Forchungszentrum Karlsruhe CY - Karlsruhe KW - interdiffusion KW - x-ray diffraction KW - thin films N2 - We have performed in-situ x-ray reflectivity and diffraction measurements in the range around 700 C. The Ge content profile in SiGe multilayers was used for simulating the x-ray reflectivity or diffraction spectra. ER -
MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO a Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SIGE MULTILAYERS AND CASCADE STRUCTURES. In \textit{XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging}. Karlsruhe: Forchungszentrum Karlsruhe, 2006, s.~124.
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