ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER a Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics. USA: American Institute of Physics, 2001, roč. 91, č. 11, s. 8974-8978. ISSN 0021-8979. |
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@article{753444, author = {Roch, Tomáš and Meduňa, Mojmír and Stangl, Julian and Hesse, Anke and Lechner, Rainer T and Bauer, Guenther and Dehlinger, G. and Diehl, L. and Gennser, U. and Müller, Elisabeth and Grützmacher, Detlev}, article_location = {USA}, article_number = {11}, keywords = {superlatitces; multilayers; scattering; quality}, language = {eng}, issn = {0021-8979}, journal = {Journal of Applied Physics}, title = {Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies}, volume = {91}, year = {2001} }
TY - JOUR ID - 753444 AU - Roch, Tomáš - Meduňa, Mojmír - Stangl, Julian - Hesse, Anke - Lechner, Rainer T - Bauer, Guenther - Dehlinger, G. - Diehl, L. - Gennser, U. - Müller, Elisabeth - Grützmacher, Detlev PY - 2001 TI - Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies JF - Journal of Applied Physics VL - 91 IS - 11 SP - 8974-8978 EP - 8974-8978 PB - American Institute of Physics SN - 00218979 KW - superlatitces KW - multilayers KW - scattering KW - quality N2 - We have investigated the structural properties of Si/SiGe electroluiminescent quantum-cascade structures, by means of x-ray reflectivity and diffraction. ER -
ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER a Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. \textit{Journal of Applied Physics}. USA: American Institute of Physics, 2001, roč.~91, č.~11, s.~8974-8978. ISSN~0021-8979.
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