| KLAPETEK, Petr, Miroslav VALTR, Petr KLENOVSKÝ a Jiří BURŠÍK. Characterization of near field optical microscope probes. Surface and Interface Analysis. USA: John Wiley & Sons., 2008, roč. 40, č. 1, s. 482-485. ISSN 0142-2421. |
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@article{769971,
author = {Klapetek, Petr and Valtr, Miroslav and Klenovský, Petr and Buršík, Jiří},
article_location = {USA},
article_number = {1},
keywords = {near field scanning optical microscopy;image artefacts;optical analysis},
language = {eng},
issn = {0142-2421},
journal = {Surface and Interface Analysis},
title = {Characterization of near field optical microscope probes},
volume = {40},
year = {2008}
}
TY - JOUR
ID - 769971
AU - Klapetek, Petr - Valtr, Miroslav - Klenovský, Petr - Buršík, Jiří
PY - 2008
TI - Characterization of near field optical microscope probes
JF - Surface and Interface Analysis
VL - 40
IS - 1
SP - 482-485
EP - 482-485
PB - John Wiley & Sons.
SN - 01422421
KW - near field scanning optical microscopy;image artefacts;optical analysis
N2 - In this article the far-field radiation analysis of near-field optical probes is presented. It is shown that the quality of probes used for near-field scanning microscopy imaging can be estimated using directional measurements of the far-field radiation patterns. Experimental results are compared with numerical modeling of far-field radiation performed using finite difference in time-domain method (FDTD) and with SEM characterization of real probe geometry. The effects of probe geometry on real measurement on different samples are studied as well.
ER -
KLAPETEK, Petr, Miroslav VALTR, Petr KLENOVSKÝ a Jiří BURŠÍK. Characterization of near field optical microscope probes. \textit{Surface and Interface Analysis}. USA: John Wiley \&{} Sons., 2008, roč.~40, č.~1, s.~482-485. ISSN~0142-2421.
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