KLAPETEK, Petr, Miroslav VALTR, Petr KLENOVSKÝ a Jiří BURŠÍK. Characterization of near field optical microscope probes. Surface and Interface Analysis. USA: John Wiley & Sons., 2008, roč. 40, č. 1, s. 482-485. ISSN 0142-2421. |
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@article{769971, author = {Klapetek, Petr and Valtr, Miroslav and Klenovský, Petr and Buršík, Jiří}, article_location = {USA}, article_number = {1}, keywords = {near field scanning optical microscopy;image artefacts;optical analysis}, language = {eng}, issn = {0142-2421}, journal = {Surface and Interface Analysis}, title = {Characterization of near field optical microscope probes}, volume = {40}, year = {2008} }
TY - JOUR ID - 769971 AU - Klapetek, Petr - Valtr, Miroslav - Klenovský, Petr - Buršík, Jiří PY - 2008 TI - Characterization of near field optical microscope probes JF - Surface and Interface Analysis VL - 40 IS - 1 SP - 482-485 EP - 482-485 PB - John Wiley & Sons. SN - 01422421 KW - near field scanning optical microscopy;image artefacts;optical analysis N2 - In this article the far-field radiation analysis of near-field optical probes is presented. It is shown that the quality of probes used for near-field scanning microscopy imaging can be estimated using directional measurements of the far-field radiation patterns. Experimental results are compared with numerical modeling of far-field radiation performed using finite difference in time-domain method (FDTD) and with SEM characterization of real probe geometry. The effects of probe geometry on real measurement on different samples are studied as well. ER -
KLAPETEK, Petr, Miroslav VALTR, Petr KLENOVSKÝ a Jiří BURŠÍK. Characterization of near field optical microscope probes. \textit{Surface and Interface Analysis}. USA: John Wiley \&{} Sons., 2008, roč.~40, č.~1, s.~482-485. ISSN~0142-2421.
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