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@inproceedings{887352,
author = {Welshons, Kenny and Dorn, Patrick and Hutanu, Andrei and Holub, Petr and Vollbrecht, John and Allen, Gabrielle},
address = {Pittsburgh, PA, USA},
booktitle = {TG '10 Proceedings of the 2010 TeraGrid Conference},
keywords = {network testbed; bandwidth on demand; eaviv},
language = {eng},
location = {Pittsburgh, PA, USA},
isbn = {978-1-60558-818-6},
pages = {1-8},
publisher = {ACM New York, NY, USA},
title = {Design and Implementation of a Production Dynamically Configurable Testbed},
url = {http://portal.acm.org/citation.cfm?id=1838574.1838595},
year = {2010}
}
TY - JOUR
ID - 887352
AU - Welshons, Kenny - Dorn, Patrick - Hutanu, Andrei - Holub, Petr - Vollbrecht, John - Allen, Gabrielle
PY - 2010
TI - Design and Implementation of a Production Dynamically Configurable Testbed
PB - ACM New York, NY, USA
CY - Pittsburgh, PA, USA
SN - 9781605588186
KW - network testbed
KW - bandwidth on demand
KW - eaviv
UR - http://portal.acm.org/citation.cfm?id=1838574.1838595
N2 - Production quality high speed networks connecting end devices are needed to design and prototype new types of distributed applications. The eaviv testbed has been deployed to provide such a facility, connecting Louisiana State University, National Center for Supercomputing Applications and Masaryk University, and enabling services for dynamic provisioning of dedicated bandwidth via Internet2 ION. This paper includes technical challenges and solutions in deploying eaviv such as dealing with multiple administrative domains, network addressing, and end-to-end connectivity. These issues apply not only to temporary testbeds, but also to networks which facilitate long-running experiments and research and whose infrastructure is global and at least partially dynamic.
ER -
WELSHONS, Kenny, Patrick DORN, Andrei HUTANU, Petr HOLUB, John VOLLBRECHT a Gabrielle ALLEN. Design and Implementation of a Production Dynamically Configurable Testbed. In \textit{TG '10 Proceedings of the 2010 TeraGrid Conference}. Pittsburgh, PA, USA: ACM New York, NY, USA, 2010, s.~1-8. ISBN~978-1-60558-818-6.
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