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@inproceedings{916529,
author = {Oberta, P. and Mikulík, Petr and Hrdý, J. and Kittler, M.},
address = {New York},
booktitle = {SRI 2009: The 10th international conference on synchrotron radiation instrumentation: AIP Conference Proceedings},
keywords = {diffractive-refractive optics; x-rays; crystals; lens; radiation},
language = {eng},
location = {New York},
isbn = {978-0-7354-0782-4},
pages = {724–727},
publisher = {American Institute of Physics},
title = {Highly asymmetric Laue focusing monochromator},
url = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=APCPCS001234000001000724000001&idtype=cvips&gifs=yes&ref=no},
year = {2010}
}
TY - JOUR
ID - 916529
AU - Oberta, P. - Mikulík, Petr - Hrdý, J. - Kittler, M.
PY - 2010
TI - Highly asymmetric Laue focusing monochromator
PB - American Institute of Physics
CY - New York
SN - 9780735407824
KW - diffractive-refractive optics
KW - x-rays
KW - crystals
KW - lens
KW - radiation
UR - http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=APCPCS001234000001000724000001&idtype=cvips&gifs=yes&ref=no
N2 - By using two highly asymmetric Laue crystals in a dispersive arrangement with a circular profile (empty set 8 mm) we have created a sagittaly focusing Laue system for the first time. The crystallographic planes (111) of the two Si crystals formed an angle of 7.95 degrees with the entrance surface. The crystals dimensions were 40 mm x 20 mm and the diffracting surface was a 0.5 mm thick neck between the two circular profiles. The 15.35 keV diffracted beam formed an angle of 0.55 degrees with the exit surface. The calculated focusing distance of the Laue-Laue focusing system was 14 m.
ER -
OBERTA, P., Petr MIKULÍK, J. HRDÝ a M. KITTLER. Highly asymmetric Laue focusing monochromator. In \textit{SRI 2009: The 10th international conference on synchrotron radiation instrumentation: AIP Conference Proceedings}. New York: American Institute of Physics, 2010, s.~724–727. ISBN~978-0-7354-0782-4.
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