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@article{951017, author = {Humlíček, Josef}, article_number = {9}, doi = {http://dx.doi.org/10.1016/j.tsf.2010.12.055}, keywords = {Ellipsometry; Infrared; Metamaterials}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials}, volume = {519}, year = {2011} }
TY - JOUR ID - 951017 AU - Humlíček, Josef PY - 2011 TI - Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials JF - Thin Solid Films VL - 519 IS - 9 SP - 2655-2658 EP - 2655-2658 PB - Elsevier SN - 00406090 KW - Ellipsometry KW - Infrared KW - Metamaterials N2 - Suitable combinations of the optical response and geometrical form of flat or curved interfaces of the constituents in nanometer-sized metamaterials can lead to a strong enhancement of local fields, seen typically as sharp spectral resonances in optical spectra. We propose a classification of the resonant phenomena in inhomogeneous systems within the effective-medium approximation, and examine their manifestation in infrared ellipsometry. We report mid-infrared ellipsometric spectra of a doped semiconductor metamaterial, exhibiting negative refraction. We provide a simple explanation for the difference in the directions of the phase- and energy propagation. The resonance responsible for a strong anisotropy and the interesting behavior of refracted light is found to lead to characteristic features in the ellipsometric spectra. ER -
HUMLÍČEK, Josef. Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials. \textit{Thin Solid Films}. Elsevier, roč.~519, č.~9, s.~2655-2658. ISSN~0040-6090. doi:10.1016/j.tsf.2010.12.055. 2011.
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