Measurement of the thickness distribution and optical constants
of non-uniform thin films

J 2011

Measurement of the thickness distribution and optical constants of non-uniform thin films

OHLÍDAL, Miloslav; Ivan OHLÍDAL; Petr KLAPETEK; David NEČAS; Abhijit MAJUMDAR et al.

Základní údaje

Originální název

Measurement of the thickness distribution and optical constants of non-uniform thin films

Název česky

Měření rozdělení tloušťek a optických konstant neuniformních tenkých vrstev

Autoři

OHLÍDAL, Miloslav; Ivan OHLÍDAL; Petr KLAPETEK; David NEČAS a Abhijit MAJUMDAR

Vydání

Measurement Science and Technology, Bristol, England, IOP Publishing, 2011, 0957-0233

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10306 Optics

Stát vydavatele

Velká Británie a Severní Irsko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 1.494

Označené pro přenos do RIV

Ano

Kód RIV

RIV/00216224:14310/11:00050733

Organizační jednotka

Přírodovědecká fakulta

DOI

https://doi.org/10.1088/0957-0233/22/8/085104

UT WoS

000292775000006

Klíčová slova česky

neuniformní tenké vrstvy; zobrazovací spektroskopická reflektometrie; rozdělení lokální tloušťky

Klíčová slova anglicky

non-uniform thin films; imaging spectroscopic reflectometry; distribution of the local thickness

Štítky

AKR, rivok

Příznaky

Mezinárodní význam, Recenzováno

Změněno: 23. 3. 2012 13:19, Mgr. David Nečas, Ph.D.

Anotace

V originále

In this paper, an original method for the complete optical characterization of thin films exhibiting area thickness non-uniformity is presented. This method is based on interpreting experimental data obtained using an original imaging spectroscopic photometer operating in the reflection mode at normal incidence of light. A CCD camera is employed as a detector of the photometer. The spectral dependences of the reflectance measured simultaneously by individual pixels of the CCD camera correspond to the local reflectance of small areas of the non-uniform thin films characterized. These areas form a matrix along a relatively large part of the substrate covered with the non-uniform film. The spectral dependences of the local reflectance measured by the individual pixels are treated separately by means of the formulae for the reflectance valid for uniform thin films. The reason is that the local areas corresponding to the pixels are sufficiently small so that the film characterized can be considered to be uniform within these local areas. Using this approach, it is possible to determine the values of the local thickness and local optical constants for every small area of the matrix. Thus, in principle it is possible to determine the distributions (maps) of the local thickness and the local optical constants of the non-uniform films simultaneously. This method is used to characterize carbon-nitride thin films exhibiting only the thickness area non-uniformity.

Návaznosti

FR-TI1/168, projekt VaV

Název: Barevné solární články s vysokou účinností pro architektonické aplikace

Investor: Ministerstvo průmyslu a obchodu ČR, Barevné solární články s vysokou účinností pro architektonické aplikace

FT-TA5/114, projekt VaV

Název: Vývoj technologie vytváření PECVD vrstev pro výrobu automobilové světelné techniky

Investor: Ministerstvo průmyslu a obchodu ČR, Vývoj technologie vytváření PECVD vrstev pro výrobu automobilové světelné techniky

MSM0021622411, záměr

Název: Studium a aplikace plazmochemických reakcí v neizotermickém nízkoteplotním plazmatu a jeho interakcí s povrchem pevných látek

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, Studium a aplikace plazmochemických reakcí v neizotermickém nízkoteplotním plazmatu a jeho interakcí s povrchem pevných látek

Citovat

OHLÍDAL, Miloslav; Ivan OHLÍDAL; Petr KLAPETEK; David NEČAS a Abhijit MAJUMDAR. Measurement of the thickness distribution and optical constants of non-uniform thin films. Measurement Science and Technology. Bristol, England: IOP Publishing, 2011, roč. 22, č. 8, s. "nestránkováno", 8 s. ISSN 0957-0233. Dostupné z: https://doi.org/10.1088/0957-0233/22/8/085104.

@article{966976,
   author = {Ohlídal, Miloslav and Ohlídal, Ivan and Klapetek, Petr and Nečas, David and Majumdar, Abhijit},
   article_location = {Bristol, England},
   article_number = {8},
   doi = {https://doi.org/10.1088/0957-0233/22/8/085104},
   keywords = {non-uniform thin films; imaging spectroscopic reflectometry; distribution of the local thickness},
   language = {eng},
   issn = {0957-0233},
   journal = {Measurement Science and Technology},
   title = {Measurement of the thickness distribution and optical constants of non-uniform thin films},
   url = {http://iopscience.iop.org/0957-0233/22/8/085104/},
   volume = {22},
   year = {2011}
}

TY  - JOUR
ID  - 966976
AU  - Ohlídal, Miloslav - Ohlídal, Ivan - Klapetek, Petr - Nečas, David - Majumdar, Abhijit
PY  - 2011
TI  - Measurement of the thickness distribution and optical constants of non-uniform thin films
JF  - Measurement Science and Technology
VL  - 22
IS  - 8
SP  - "nestránkováno"
EP  - "nestránkováno"
PB  - IOP Publishing
SN  - 09570233
KW  - non-uniform thin films
KW  - imaging spectroscopic reflectometry
KW  - distribution of the local thickness
UR  - http://iopscience.iop.org/0957-0233/22/8/085104/
L2  - http://iopscience.iop.org/0957-0233/22/8/085104/
N2  - In this paper, an original method for the complete optical characterization of thin films exhibiting area thickness non-uniformity is presented. This method is based on interpreting experimental data obtained using an original imaging spectroscopic photometer operating in the reflection mode at normal incidence of light. A CCD camera is employed as a detector of the photometer. The spectral dependences of the reflectance measured simultaneously by individual pixels of the CCD camera correspond to the local reflectance of small areas of the non-uniform thin films characterized. These areas form a matrix along a relatively large part of the substrate covered with the non-uniform film. The spectral dependences of the local reflectance measured by the individual pixels are treated separately by means of the formulae for the reflectance valid for uniform thin films. The reason is that the local areas corresponding to the pixels are sufficiently small so that the film characterized can be considered to be uniform within these local areas. Using this approach, it is possible to determine the values of the local thickness and local optical constants for every small area of the matrix. Thus, in principle it is possible to determine the distributions (maps) of the local thickness and the local optical constants of the non-uniform films simultaneously. This method is used to characterize carbon-nitride thin films exhibiting only the thickness area non-uniformity.
ER  -

OHLÍDAL, Miloslav; Ivan OHLÍDAL; Petr KLAPETEK; David NEČAS a Abhijit MAJUMDAR. Measurement of the thickness distribution and optical constants of non-uniform thin films. \textit{Measurement Science and Technology}. Bristol, England: IOP Publishing, 2011, roč.~22, č.~8, s.~''nestránkováno'', 8 s. ISSN~0957-0233. Dostupné z: https://doi.org/10.1088/0957-0233/22/8/085104.

Přehled o publikaci