Masaryk University

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    2021

    1. Nanoimaging of Orientational Defects in Semiconducting Organic Films
      MRKYVKOVA, Nada, Adrian CERNESCU, Zdenek FUTERA, Alois NEBOJSA, Adam DUBROKA, Michaela SOJKOVA, Martin HULMAN, Eva MAJKOVA, Matej JERGEL, Peter SIFFALOVIC and Frank SCHREIBER. Nanoimaging of Orientational Defects in Semiconducting Organic Films. Journal of Physical Chemistry C. Washington D.C.: American Chemical Society, 2021, vol. 125, No 17, p. 9229-9235. ISSN 1932-7447. Available from: https://dx.doi.org/10.1021/acs.jpcc.1c00059.
      URL
      RIV/00216224:14310/21:00119566 Article in a journal. English. United States of America.
      Mrkyvkova, Nada (guarantor) -- Nebojsa, Alois (203 Czech Republic, belonging to the institution) -- Dubroka, Adam (203 Czech Republic, belonging to the institution)
      Keywords in English: Molecular properties; Defects; Layers; Molecules; Oscillation
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 14/1/2022 15:52.
      More: https://is.muni.cz/publication/1821618/en

    2019

    1. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS
      KASPAR, P., D. SOBOLA, R. DALLAEV, S. RAMAZANOV, Alois NEBOJSA, S. REZAEE and L. GRMELA. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. Applied Surface Science. AMSTERDAM: Elsevier Science BV, 2019, vol. 493, NOV 1 2019, p. 673-678. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2019.07.058.
      URL
      RIV/00216224:14310/19:00113443 Article in a journal. English. Netherlands.
      Kaspar, P. (guarantor) -- Nebojsa, Alois (203 Czech Republic, belonging to the institution)
      Keywords in English: Graphite; Fe2O3; Ellipsometry; XPS; AFM
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 1/4/2020 11:20.
      More: https://is.muni.cz/publication/1641519/en
    2. Characterization of the native oxide on CdTe surfaces
      SOBOLA, Dinara, Pavel KASPAR, Alois NEBOJSA, Dušan HEMZAL, Lubomir GRMELA and Steve SMITH. Characterization of the native oxide on CdTe surfaces. Materials Science-Poland. Warsaw: SCIENDO, 2019, vol. 37, No 2, p. 206-211. ISSN 2083-1331. Available from: https://dx.doi.org/10.2478/msp-2019-0030.
      Full Text
      RIV/00216224:14310/19:00113013 Article in a journal. English. Poland.
      Nebojsa, Alois (203 Czech Republic) -- Hemzal, Dušan (203 Czech Republic, guarantor, belonging to the institution)
      Keywords in English: selective etching; scanning probe microscopy; ellipsometry; Raman spectroscopy
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 11/5/2020 17:44.
      More: https://is.muni.cz/publication/1625256/en

    2011

    1. Infrared ellipsometry of highly oriented pyrolytic graphite
      HUMLÍČEK, Josef, Alois NEBOJSA, Filip MÜNZ, Milka MIRIC and Rados GAJIC. Infrared ellipsometry of highly oriented pyrolytic graphite. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2624-2626. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.091.
      Name (in English): Infrared ellipsometry of highly oriented pyrolytic graphite
      RIV/00216224:14310/11:00053213 Article in a journal. Solid-state physics and magnetism. English. Switzerland.
      Humlíček, Josef (203 Czech Republic, guarantor, belonging to the institution) -- Nebojsa, Alois (203 Czech Republic, belonging to the institution) -- Münz, Filip (203 Czech Republic, belonging to the institution) -- Miric, Milka (688 Serbia) -- Gajic, Rados (688 Serbia)
      Keywords in English: Ellipsometry; Infrared; Graphite
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 6/1/2014 13:23.
      More: https://is.muni.cz/publication/951019/en

    2008

    1. Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry
      FIKAROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry. physica status solidi (c). 2008, vol. 5, No 5, p. 1176-1179. ISSN 1610-1642.
      Name in Czech: Dynamika UV degradace PMPSi ve vakuu a na vzduchu s využitím in-situ elipsometrie
      Name (in English): Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry
      RIV/00216224:14310/08:00027153 Article in a journal. Solid-state physics and magnetism. English. Germany.
      Fikarová Zrzavecká, Olga (203 Czech Republic) -- Nebojsa, Alois (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Nešpůrek, Stanislav (203 Czech Republic) -- Humlíček, Josef (203 Czech Republic, guarantor)
      Keywords in English: vacuum spectroscopic ellipsometry; ultraviolet exposure; PMPSi; polymers
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 9/4/2010 15:46.
      More: https://is.muni.cz/publication/806281/en
    2. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel
      NEBOJSA, Alois, Olga FIKAROVÁ ZRZAVECKÁ, Karel NAVRÁTIL and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel. physica status solidi (c). 2008, vol. 5, No 5, p. 1176-1179. ISSN 1610-1642.
      Name in Czech: Teplotní závislost elipsometrických spekter Fe a CrNiAl oceli
      RIV/00216224:14310/08:00027154 Article in a journal. Solid-state physics and magnetism. English. Germany.
      Nebojsa, Alois (203 Czech Republic, guarantor) -- Fikarová Zrzavecká, Olga (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Humlíček, Josef (203 Czech Republic)
      Keywords in English: spectroscopic ellipsometry; iron; CrNiAl steel; temperature dependence
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 9/4/2010 15:46.
      More: https://is.muni.cz/publication/806291/en

    2004

    1. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS
      ČECHAL, Jan, Petr TICHOPÁDEK, Alois NEBOJSA, Olga BONAVENTUROVÁ ZRZAVECKÁ, Michal URBÁNEK, Jiří SPOUSTA, Karel NAVRÁTIL and Tomáš ŠIKOLA. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis. USA: John Wiley & Sons, 2004, vol. 2004, No 36, p. 1218-1221. ISSN 0142-2421.
      Name in Czech: Analýza PMPSi metodou spektroskopické elipsometrie a XPS
      Name (in English): In situ analysis of PMPSi by spectroscopic ellipsometry and XPS
      RIV/00216224:14310/04:00010399 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Čechal, Jan (203 Czech Republic) -- Tichopádek, Petr (203 Czech Republic) -- Nebojsa, Alois (203 Czech Republic) -- Bonaventurová Zrzavecká, Olga (203 Czech Republic, guarantor) -- Urbánek, Michal (203 Czech Republic) -- Spousta, Jiří (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Šikola, Tomáš (203 Czech Republic)
      Keywords in English: spectroscopic ellipsometry; x-ray photoelectron spectroscopy; XPS; polysilanes; PMPSi
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Olga Fikarová Zrzavecká, učo 11887. Changed: 4/1/2009 10:30.
      More: https://is.muni.cz/publication/559741/en
    2. In situ analysis of PMPSi thin films by spectroscopic ellipsometry
      BRANDEJSOVÁ, Eva, Jan ČECHAL, Olga BONAVENTUROVÁ ZRZAVECKÁ, Alois NEBOJSA, Petr TICHOPÁDEK, Michal URBÁNEK, Karel NAVRÁTIL, Tomáš ŠIKOLA and Josef HUMLÍČEK. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2004, 9/2004, No 9, p. 260-262. ISSN 0447-6441.
      Name in Czech: In situ analýza tenkých vrstev PMPSi metodou spektroskopické elipsometrie
      Name (in English): In situ analysis of PMPSi thin films by spectroscopic ellipsometry
      RIV/00216224:14310/04:00010983 Article in a journal. Solid-state physics and magnetism. English. Czech Republic.
      Brandejsová, Eva (203 Czech Republic) -- Čechal, Jan (203 Czech Republic) -- Bonaventurová Zrzavecká, Olga (203 Czech Republic) -- Nebojsa, Alois (203 Czech Republic) -- Tichopádek, Petr (203 Czech Republic) -- Urbánek, Michal (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Šikola, Tomáš (203 Czech Republic) -- Humlíček, Josef (203 Czech Republic, guarantor)
      Keywords in English: spectroscopic ellipsometry; poly(methyl-phenylsilane)
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 9/2/2007 14:26.
      More: https://is.muni.cz/publication/566971/en
    3. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)
      BONAVENTUROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). Thin Solid Films. Elsevier, 2004, 455/2004, may, p. 278-282. ISSN 0040-6090.
      Name in Czech: Teplotní závislost elipsometrických spekter poly(methyl-phenylsilanu)
      Name (in English): Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)
      RIV/00216224:14310/04:00010108 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Bonaventurová Zrzavecká, Olga (203 Czech Republic, guarantor) -- Nebojsa, Alois (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Nešpůrek, Stanislav (203 Czech Republic) -- Humlíček, Josef (203 Czech Republic)
      Keywords in English: temperature; ellipsometric spectra; poly(methyl-phenylsilane);
      International impact: yes
      Reviewed: yes
      Changed by: doc. RNDr. Karel Navrátil, CSc., učo 1646. Changed: 13/2/2007 16:32.
      More: https://is.muni.cz/publication/555504/en

    1999

    1. Optical characterisation of a thick MOVPE InSb film on GaAs
      LORENC, Michal, Jan ŠIK, Alois NEBOJSA, Karel NAVRÁTIL, Josef HUMLÍČEK, V. VORLIČEK and E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague: Institute of Physics ASCR, CR, 1999, p. 369-372. ISBN 80-238-3551-3.
      Name (in English): Optical characterisation of a thick MOVPE InSb film on GaAs
      RIV/00216224:14310/99:00000929 Proceedings paper. Solid-state physics and magnetism. English. Czech Republic.
      Lorenc, Michal (203 Czech Republic) -- Šik, Jan (203 Czech Republic) -- Nebojsa, Alois (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Humlíček, Josef (203 Czech Republic)
      Keywords in English: MOVPE; InSb; ellipsometry; reflectance; Raman; annealing
      Changed by: RNDr. JUDr. Vladimír Šmíd, CSc., učo 1084. Changed: 29/5/2004 18:44.
      More: https://is.muni.cz/publication/204851/en

    1998

    1. Deposition of metal nitrides by IBAD
      ŠIKOLA, T., J. SPOUSTA, R. ČEŠKA, J. ZLÁMAL, L. DITTRICHOVÁ, Alois NEBOJSA, Karel NAVRÁTIL, D. RAFAJA, J. ZEMEK and V. PEŘINA. Deposition of metal nitrides by IBAD. Surface & coatings technology. Elsevier Science, 1998, vol. 1998, 108-109, p. 284-291. ISSN 0257-8972.
      Name (in English): Deposition of metal nitrides by IBAD
      RIV: Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Changed by: RNDr. Alois Nebojsa, učo 2222. Changed: 12/5/1999 12:56.
      More: https://is.muni.cz/publication/200391/en
    2. Ellipsometry and transport studies of thin-film metal nitrides
      HUMLÍČEK, Josef, Alois NEBOJSA, J. HORA, M. STRÁSKÝ, J. SPOUSTA and T. ŠIKOLA. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, No 332, p. 25-29. ISSN 0040-6090.
      Name (in English): Ellipsometry and transport studies of thin-film metal nitrides
      RIV/00216224:14310/98:00000754 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Keywords in English: ellipsometry
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 10/1/2000 15:36.
      More: https://is.muni.cz/publication/200254/en
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