Výpis publikací

KUČÍRKOVÁ, Assja, Karel NAVRÁTIL a J. ZEMEK. Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films. Thin Solid Films. UK Oxford: Elsevier science, 1998, (323)1998, -, s. 53-58. ISSN 0040-6090.

KUČÍRKOVÁ, Assja a Karel NAVRÁTIL. Influence of Oxygen Concentration on Optical Properties of Semi-insulating Polycrystalline Silicon Films. Appl. Phys. A. Springer-Verlag, 1996, roč. 1996, A63, s. 495-503.

KUČÍRKOVÁ, Assja a Karel NAVRÁTIL. Interpretation of infrared transmittance spectra of SiO 2 thin films. Applied Spectroscopy. USA: Society Appl. Spectroscopy, 1994, roč. 48(1994), č. 1, s. 113-120. ISSN 0003-7028.

KUČÍRKOVÁ, Assja a Karel NAVRÁTIL. Undesirable Occurrence of the Interference Fringes in IR Transmittance Spectra. Scripta Fac.Brun. 1994, roč. 29(1994), č. 1, s. -, -. ISSN 2101-2986.