Výpis publikací

SCHUMI-MAREČEK, David, Florian BERTRAM, Petr MIKULÍK, Devanshu VARSHNEY, Jiří NOVÁK a Stefan KOWARIK. Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating. Journal of Applied Crystallography. International Union of Crystallography, 2024, roč. 57, č. 2, s. 314-323. ISSN 1600-5767. Dostupné z: https://dx.doi.org/10.1107/S1600576724001171.

VARSHNEY, Devanshu. The characterization and growth of hexamethoxytriphenylene organic semiconductor molecules on graphene/SiC-6H and virgin SiC-6H substrates. Mareček David, Mikulik Petr , Kowarik Stefan. In KRAJŇÁK, Tomáš, Jan ČECHAL, Jan KUNC a Jiří NOVÁK. SCHOOL OF XFEL AND SYNCHROTRON RADIATION USERS "SFEL2022". 2022. ISBN 978-80-574-0130-8.