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Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating J - Článek v odborném periodikuSCHUMI-MAREČEK, David; Florian BERTRAM; Petr MIKULÍK; Devanshu VARSHNEY; Jiří NOVÁK a Stefan KOWARIK. Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating. Journal of Applied Crystallography. International Union of Crystallography, 2024, roč. 57, č. 2, s. 314-323. ISSN 1600-5767. Dostupné z: https://doi.org/10.1107/S1600576724001171.Podrobněji: https://is.muni.cz/publication/2394837/cs
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The characterization and growth of hexamethoxytriphenylene organic semiconductor molecules on graphene/SiC-6H and virgin SiC-6H substrates k - Prezentace na konferencíchVARSHNEY, Devanshu. The characterization and growth of hexamethoxytriphenylene organic semiconductor molecules on graphene/SiC-6H and virgin SiC-6H substrates. Mareček David, Mikulik Petr , Kowarik Stefan. In KRAJŇÁK, Tomáš; Jan ČECHAL; Jan KUNC a Jiří NOVÁK. SCHOOL OF XFEL AND SYNCHROTRON RADIATION USERS "SFEL2022". 2022. ISBN 978-80-574-0130-8.Podrobněji: https://is.muni.cz/publication/2237437/cs