Výpis publikací

HOLÝ, Václav; T. BAUMBACH; D. LÜBBERT; L. HELFEN; M. ELLYAN; Petr MIKULÍK; S. KELLER; S.P. DENBAARS a J. SPECK. Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis. Physical Review B. USA: The American Physical Society, 2008, roč. 77, č. 1, s. 094102-94110. ISSN 1098-0121.

LÜBBERT, D.; T. BAUMBACH; Václav HOLÝ; Petr MIKULÍK; L. HELFEN; P. PERNOT; M. ELLYAN; S. KELLER; T.M. KATONA; S.P. DENBAARS a J. SPECK. Microdiffraction imaging of dislocation densities in microstructured samples. Europhysics Letters. Paríž: European Physical Society, 2008, roč. 82, č. 5, s. 56002-56006. ISSN 0295-5075.

MIKULÍK, Petr; D. LÜBBERT; P. PERNOT; L. HELFEN a T. BAUMBACH. Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2006, roč. 253, č. 1, s. 188-193. ISSN 0169-4332.