PřF:FK010 Struct. analys. in solid state - Course Information

FK010 Structural analysis methods in condensed matter physics

Extent and Intensity

2/1/0. 3 credit(s) (plus extra credits for completion). Type of Completion: zk (examination).

Teacher(s)

doc. Mgr. Ondřej Caha, Ph.D. (lecturer)
doc. Mgr. Ondřej Caha, Ph.D. (seminar tutor)
Mgr. Jiří Novák, Ph.D. (seminar tutor)

Guaranteed by

doc. Mgr. Ondřej Caha, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. Mgr. Ondřej Caha, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science

Course Enrolment Limitations

The course is offered to students of any study field.

Course objectives

The aim is to introduce students to the basic techniques of structural analysis of condensed matter, which include methods based on the interaction of X-rays with matter and methods using neutron and electron scattering.

Learning outcomes

Upon successful completion of this course, students should be able to
- understand the physical principles of structural methods
- design an appropriate experimental procedure for a given structural problem
- use the experimental facilities of the Institute to determine the structure of a given condensed matter
- evaluate the experimental data and compare with the theoretical model

Syllabus

• 1. Properties of x-rays, Thomson x-ray scattering from an electron, scattering from atoms, atomic form-factor. X-ray absorption, basics of x-ray absorption spectroscopy.
• 2. Scattering of x-rays from a crystalline solid, x-ray diffraction, kinematical approximation, far-field limit.
• 3. Kinematical x-ray diffraction from crystalline thin layers, determination of lattice parameters and degree of plastic relaxation of a layer.
• 4. Diffraction from polycrystals. The Rietveld method, phase analysis.
• 5. Small-angle x-ray scattering, SAXS and GISAXS methods, x-ray reflection, determination of the layer thickness and roughness of interfaces
• 6. X-ray scattering from nanostructures, the Debye formula, pair distribution function, determination of mean size of nanoparticles.
• 7. Coherent diffraction, phase problem in scattering theory.
• 8. Laboratory and synchrotron x-ray sources, x-ray optics, x-ray detectors.
• 9. Properties of neutrons, interaction of neutrons with matter, nuclear and magnetic neutron scattering.
• 10. Neutron sources and detectors, neutron optics.
• 11. Application of neutron scattering - study of lattice dynamics and magnetic order in solids.
• 12. Interaction of electrons with matter, penetration depth, quantum description of electron scattering.
• 13. Transmission electron microscopy - principles and image formation.
• 14. Scanning electron microscopy, principles, image formation, scanning transmission electron microscopy.
• 15. Chemical analysis with electrons, methods EELS, EDX, WDX.
• 16. EBSD method
• 17. Sample preparation for electron microscopy, FIB method

Literature

• J. Als-Nielsen and D. McMorrow, Elements of Modern X-ray Physics, Wiley 2011
• D. B.Williams and C.B. Carter, Transmission Electron Microscopy, Springer 1996
• U. Pietsch et al., High-resolution x-ray scattering from thin films and nanostructures, Springer 2004
• G. L. Squires, Introduction to the Theory of Thermal Neutron Scattering, Cambridge Univ. Press 2012
• J. Goldstein et al., Scanning Electron Microscopy and X-ray Microanalysis, Springer 2003

Teaching methods

Lecture and exercises. The exercises include laboratory work on instruments in the laboratories of the Institute. The laboratory work will be include the following tasks:
1. Qualitative phase analysis of a polycrystalline sample, Rietveld refinement of atomic positions in a elementary cell
2. Determination of the degree of plastic relaxation in the  epitaxial layer, estimation of the density of misfit dislocations
3. Determination of thin layer thickness and rms interface roughness by X-ray reflection
4. Determination of the mean size of nanoparticles and the degree of correlation of their positions by small-angle X-ray scattering.

The RIGAKU Smartlab9kW and RIGAKU Smartlab3kW diffractometers at the  CEITEC core facility as well as the RIGAKU Smartlab3kW diffractometer at the UFKL (CEPLANT) will be used to  solve these tasks.

Assessment methods

oral exam the part of the exam is home assignement -- evaluation of selected experimental task.

Language of instruction

Czech

Further Comments

Study Materials

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