C7031 Analytical Atomic Spectrometry

Faculty of Science
Autumn 2010
Extent and Intensity
2/0/0. 2 credit(s) (fasci plus compl plus > 4). Recommended Type of Completion: zk (examination). Other types of completion: k (colloquium).
Teacher(s)
prof. RNDr. Viktor Kanický, DrSc. (lecturer)
prof. RNDr. Vítězslav Otruba, CSc. (lecturer)
Guaranteed by
prof. RNDr. Vítězslav Otruba, CSc.
Department of Chemistry – Chemistry Section – Faculty of Science
Timetable
Mon 14:00–15:50 C12/311
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Electromagnetic radiation, Planck radiation law, Einstein laws, metrology. Optical dispersion modules, basic of instrumentation. Emission and absorption spectrometry of atoms, ions and molecules - emission flame, arc, spark, laser, hole cathodes, glow discharge plazma of inert gases.
Syllabus
  • 1. Electromagnetic radiation, electromagnetic wave, the speed in a vacuum, Poyntig vector, Planck law. The interaction of radiation with matter. Einstein law for the absorption and emission of radiation. Metrology electromagnetic radiation. Energy values radiant flux, flux density, radiant energy, energy density, intensity of radiation, radiance. Integral and monochrome (spectral) values. Photometric quantities luminous flux, luminous intensity, brightness, lighting. 2. Measuring sources of electromagnetic radiation. Sources IR UV-VIS-continuous spectrum (heat sources described Planck radiation law), UV-X-rays (braking radiation). Plasma source of continuous spectrum of IR-UV-VIS (D2 lamp, Xe). Sources bar spectrum VUV-UV-VIS (low lamps) and X-ray (X-ray tube, synchrotron). Semiconductor radiation source (LED). Coherent radiation sources (gas, dye and semiconductor lasers) 3. Disperse elements for frequency analysis radiation in the IR-UV-VIS (prisms, grids, Interferometry). Monochromators and polychromators UV - VIS, optical structure, properties 4. radiation detectors UV-VIS, based on thermal effects (thermocouples), the external and internal photoelectric ( phototube, photomultiplier, photovoltaic cells). Area integrated detectors (CCD, CID ..) 5 Atomic absorption spectrometry (AAS). Principle AAS, absorption and emission line profiles of atoms, Bouger-Lamber-Beer's Law in the AAS. Atomization in AAS (flames, electrothermal atomizers). Spectral interference, non-selective absorption of radiation, causes and methods of correction. Non-spectral interferences. 6 optical emission spectroscopy UV-VIS (OES). Overview of methodologies OES. Heat, radiant and electron excitation of molecules, atoms and ions. Boltzmann Law. ionization and Saha equation, excitation source in the OES. Theoretical Foundations of emissions and absorption of radiation, Kirchhoff law. Course emission of radiation depending on the concentration of the analyte. 7 gas emission spectroscopy of molecules and atoms (FES). Molecular and atomic spectra. Instrumentation in FES: flames, sample transport, separation and detection of radiation. Spectral and nespektrální interference. Analytical properties FES 8. Obloukova and Intrinsic OES, classic option emission spektrografie. Intrinsic and generators arc, character arc and spark spectrum. spectrograph with photographic detection, spectrometers with photoelectric detection. Use vacuum field UV spectrum. Analytical characteristics and scope. 9 inductively coupled plasma (ICP) in the OES. The principle function, excitation mechanisms in argon plasma ICP. spectral characteristics of the ICP analytical perspective, the calibration dependence, the extent of , linearity, limits of detection. Spectral interference and other interference in ICP OES. ICP mass spectrometers. 10 Shocks under reduced pressure in the OES. Izotermic and non-izotermic plasma. Geissler tube and gas analysis. discharges in hollow cathode, application of isotope and trace analysis. Grimm discharge, spectral characteristics and the design layout. Analysis of surface layers and applications in engineering practices. 11 atomic fluorescence spectrometry. The principle of this method, the analytical parameters (sensitivity, limit of detection, the concentration range) 12. Elementary Analysis of X-ray beams. Establishment of primary and fluorescent X-ray radiation. Serie lines and their symbolism, non-radiative marches in the atom (secondary and Auger electrons). Wave dispersive X-ray fluorescence spectrometers for simultaneous and sequential, and their analytical properties. Energodisperzní application of X-ray spectrometers and 13. radiation interference in the X-ray spectrometry, and their correction. X-ray absorption spectroscopy and its analytical applications. Nezářivé interference and elimination of sample preparation and mathematical corrections. Practical applications. 14 X-ray spectrometry excitation radiation charged particles. electron microprobe and scanning electron microscope as a source of primary X-ray radiation and their applications for local mikroanalýzu. Principle and analysis of X-ray radiation alarm protons and ions.
Literature
  • KANICKÝ, Viktor, Vítězslav OTRUBA, Lumír SOMMER and Jiří TOMAN. Optická emisní spektrometrie v indukčně vázaném plazmatu a vysokoteplotních plamenech (Optical emission spectrometry in inductiveky coupled plasma and high temperature flames). 1. st. Praha: Academia, 1992, 152 pp. Pokroky chemie 24. ISBN 80-200-0215-4. info
  • Analytická příručka. Edited by Jaroslav Zýka. 4., upr. vyd. Praha: SNTL - Nakladatelství technické literatury, 1988, 831 s. info
  • Analytická příručka. Díl I [Zýka, 1988]. Edited by Jaroslav Zýka. 4. upr. vyd. Praha: SNTL - Nakladatelství technické literatury, 1988, 678 s. info
Teaching methods
lectures
Assessment methods
lecture, oral examination
Language of instruction
Czech
Further Comments
Study Materials
The course can also be completed outside the examination period.
The course is taught annually.
Teacher's information
http://www.chemi.muni.cz/~lpca/
The course is also listed under the following terms Autumn 2007 - for the purpose of the accreditation, Autumn 1999, Autumn 2010 - only for the accreditation, Autumn 2000, Autumn 2001, Autumn 2002, Autumn 2003, Autumn 2004, Autumn 2005, Autumn 2006, Autumn 2007, Autumn 2008, Autumn 2009, Autumn 2011, Autumn 2011 - acreditation, Autumn 2012, Autumn 2013, Autumn 2014, Autumn 2015, Autumn 2016, autumn 2017, Autumn 2018, Spring 2020, Spring 2021, Spring 2022, Spring 2023, Spring 2024, Spring 2025.
  • Enrolment Statistics (Autumn 2010, recent)
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