PřF:C7031 Analytical Atomic Spectrometry - Course Information
C7031 Analytical Atomic SpectrometryFaculty of Science
- Extent and Intensity
- 2/0/0. 2 credit(s) (fasci plus compl plus > 4). Recommended Type of Completion: zk (examination). Other types of completion: k (colloquium).
- prof. RNDr. Viktor Kanický, DrSc. (lecturer)
prof. RNDr. Vítězslav Otruba, CSc. (lecturer)
- Guaranteed by
- prof. RNDr. Viktor Kanický, DrSc.
Department of Chemistry - Chemistry Section - Faculty of Science
Supplier department: Department of Chemistry - Chemistry Section - Faculty of Science
- Mon 10:00–11:50 A14-207
- Course Enrolment Limitations
- The course is also offered to the students of the fields other than those the course is directly associated with.
- fields of study / plans the course is directly associated with
- Course objectives
- Electromagnetic radiation, Planck radiation law, Einstein laws, metrology. Optical dispersion modules, basic of instrumentation. Emission and absorption spectrometry of atoms, ions and molecules - emission flame, arc, spark, laser, hole cathodes, glow discharge plazma of inert gases.
- 1. Electromagnetic radiation, electromagnetic wave, the speed in a vacuum, Poyntig vector, Planck law. The interaction of radiation with matter. Einstein law for the absorption and emission of radiation. Metrology electromagnetic radiation. Energy values radiant flux, flux density, radiant energy, energy density, intensity of radiation, radiance. Integral and monochrome (spectral) values. Photometric quantities luminous flux, luminous intensity, brightness, lighting. 2. Measuring sources of electromagnetic radiation. Sources IR UV-VIS-continuous spectrum (heat sources described Planck radiation law), UV-X-rays (braking radiation). Plasma source of continuous spectrum of IR-UV-VIS (D2 lamp, Xe). Sources bar spectrum VUV-UV-VIS (low lamps) and X-ray (X-ray tube, synchrotron). Semiconductor radiation source (LED). Coherent radiation sources (gas, dye and semiconductor lasers) 3. Disperse elements for frequency analysis radiation in the IR-UV-VIS (prisms, grids, Interferometry). Monochromators and polychromators UV - VIS, optical structure, properties 4. radiation detectors UV-VIS, based on thermal effects (thermocouples), the external and internal photoelectric (phototube, photomultiplier, photovoltaic cells). Area integrated detectors (CCD, CID ..) 5 Atomic absorption spectrometry (AAS). Principle AAS, absorption and emission line profiles of atoms, Bouger-Lamber-Beer's Law in the AAS. Atomization in AAS (flames, electrothermal atomizers). Spectral interference, non-selective absorption of radiation, causes and methods of correction. Non-spectral interferences. 6 optical emission spectroscopy UV-VIS (OES). Overview of methodologies OES. Heat, radiant and electron excitation of molecules, atoms and ions. Boltzmann Law. ionization and Saha equation, excitation source in the OES. Theoretical Foundations of emissions and absorption of radiation, Kirchhoff law. Course emission of radiation depending on the concentration of the analyte. 7 gas emission spectroscopy of molecules and atoms (FES). Molecular and atomic spectra. Instrumentation in FES: flames, sample transport, separation and detection of radiation. Spectral and non-spectral interference. Analytical properties FES 8. Arc and Intrinsic OES, classic option emission spectrography. Intrinsic and generators arc, character of arc and spark spectra. Spectrograph with photographic detection, spectrometers with photoelectric detection. Use of vacuum field UV spectrum. Analytical characteristics and scope. 9 Inductively coupled plasma (ICP) in the OES. The principle function, excitation mechanisms in argon plasma ICP. spectral characteristics of the ICP analytical perspective, the calibration dependence, the extent of, linearity, limits of detection. Spectral interference and other interference in ICP OES. ICP mass spectrometers. 10 Shocks under reduced pressure in the OES. Isothermic and non-isothermic plasma. Geissler tube and gas analysis. discharges in hollow cathode, application of isotope and trace analysis. Grimm discharge, spectral characteristics and the design layout. Analysis of surface layers and applications in engineering practices. 11 atomic fluorescence spectrometry. The principle of this method, the analytical parameters (sensitivity, limit of detection, the concentration range) 12. Elementary Analysis of X-ray beams. Establishment of primary and fluorescent X-ray radiation. Series of lines and their symbolism, non-radiative marches in the atom (secondary and Auger electrons). Wave dispersive X-ray fluorescence spectrometers for simultaneous and sequential, and their analytical properties. Energy dispersive application of X-ray spectrometers and 13. radiation interference in the X-ray spectrometry, and its correction. X-ray absorption spectroscopy and its analytical applications. Non-radiative interference and elimination of sample preparation and mathematical corrections. Practical applications. 14 X-ray spectrometry excitation radiation charged particles. electron microprobe and scanning electron microscope as a source of primary X-ray radiation and their applications for local micro-analysis. Principle and analysis of X-ray radiation alarm protons and ions.
- KANICKÝ, Viktor, Vítězslav OTRUBA, Lumír SOMMER and Jiří TOMAN. Optická emisní spektrometrie v indukčně vázaném plazmatu a vysokoteplotních plamenech (Optical emission spectrometry in inductiveky coupled plasma and high temperature flames). 1. st. Praha: Academia, 1992. 152 pp. Pokroky chemie 24. ISBN 80-200-0215-4. info
- Analytická příručka. Díl I [Zýka, 1988]. Edited by Jaroslav Zýka. 4. upr. vyd. Praha: SNTL - Nakladatelství technické literatury, 1988. 678 s. info
- Analytická příručka. Díl II [Zýka, 1988]. Edited by Jaroslav Zýka. 4. upr. vyd. Praha: SNTL - Nakladatelství technické literatury, 1988. 831 s. info
- Teaching methods
- Assessment methods
- lecture, oral examination
- Language of instruction
- Further Comments
- Study Materials
The course can also be completed outside the examination period.
The course is taught annually.
- Teacher's information