C8080 Analytical Electron Microscopy in Materials Chemistry

Faculty of Science
Autumn 2016
Extent and Intensity
2/0/0. 2 credit(s) (plus extra credits for completion). Type of Completion: zk (examination).
Teacher(s)
RNDr. Jiří Buršík, DSc. (lecturer)
prof. Mgr. Tomáš Kruml, CSc. (lecturer)
Guaranteed by
RNDr. Jiří Buršík, DSc.
Department of Chemistry – Chemistry Section – Faculty of Science
Supplier department: Department of Chemistry – Chemistry Section – Faculty of Science
Prerequisites
Physics, mathematics and chemistry on graduate level.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Students will get familiar with principles of electron microscopy (both transmission and scanning e. m.). Basics of theory of imaging and diffraction will be discussed; an attention will be paid also to various analytical methods for characterization of bulk and powder materials (alloys, chemical compounds, nanoparticles). Lectures will be supplemented by several practical sessions at lecturer's workplace.
Syllabus
  • Interaction of electrons with solids, types of electron microscopes. Imaging in a transmission electron microscope (TEM), specimens for the microscopy. Electron diffraction (scattering on an atom and a lattice, point diffraction pattern, Ewald construction, deviation from the exact reflection condition). TEM diffraction contrast (extinction contours, contrast of crystal defects). Kinematical and dynamical theory of contrast. Kikuchi lines. Practical tasks of electron diffraction and TEM. Application of stereology. High resolution electron microscopy. Microdiffraction, CBED. Scanning electron microscopy (SEM),analytical methods in electron microscopy (X-ray microanalysis, backscattered electron diffraction). Practical demonstrations.
Literature
    required literature
  • KARLÍK, Miroslav. Úvod do transmisní elektronové mikroskopie. Vyd. 1. Praha: České vysoké učení technické v Praze, 2011, 321 s. ISBN 9788001047293. info
    recommended literature
  • GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003, xix, 689 s. ISBN 0-306-47292-9. info
  • Transmission electron microscopy : physics of image formation and microanalysis. Edited by Ludwig Reimer. 3. ed. Berlin: Springer, 1993, 545 s. ISBN 3540568492. info
Teaching methods
lectures, 2-3 practical sessions
Assessment methods
exam
Language of instruction
Czech
The course is also listed under the following terms Autumn 2015, Autumn 2018, Autumn 2019, Autumn 2020, Autumn 2022, Autumn 2023, Autumn 2024.
  • Enrolment Statistics (Autumn 2016, recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2016/C8080