Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study
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NEUHOLD, Alfred; Stefanie FLADISCHER; Stefan MITSCHE; Heinz-Georg FLESCH; Armin MOSER; Jiří NOVÁK; Detlef M SMILGIES; Elke KRAKER; Bernhard LAMPRECHT; Anja HAASE; Werner GROGGER a Roland RESEL
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Journal of Applied Physics, Melville, USA, American Institute of Physics, 2011, 0021-8979
NEUHOLD, Alfred; Stefanie FLADISCHER; Stefan MITSCHE; Heinz-Georg FLESCH; Armin MOSER; Jiří NOVÁK; Detlef M SMILGIES; Elke KRAKER; Bernhard LAMPRECHT; Anja HAASE; Werner GROGGER a Roland RESEL. Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study. Journal of Applied Physics. Melville, USA: American Institute of Physics, 2011, roč. 110, č. 11, 7 s. ISSN 0021-8979. Dostupné z: https://doi.org/10.1063/1.3667171.
@article{1123341, author = {Neuhold, Alfred and Fladischer, Stefanie and Mitsche, Stefan and Flesch, HeinzandGeorg and Moser, Armin and Novák, Jiří and Smilgies, Detlef M and Kraker, Elke and Lamprecht, Bernhard and Haase, Anja and Grogger, Werner and Resel, Roland}, article_location = {Melville, USA}, article_number = {11}, doi = {https://doi.org/10.1063/1.3667171}, language = {eng}, issn = {0021-8979}, journal = {Journal of Applied Physics}, title = {Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study}, volume = {110}, year = {2011} }
TY - JOUR ID - 1123341 AU - Neuhold, Alfred - Fladischer, Stefanie - Mitsche, Stefan - Flesch, Heinz-Georg - Moser, Armin - Novák, Jiří - Smilgies, Detlef M - Kraker, Elke - Lamprecht, Bernhard - Haase, Anja - Grogger, Werner - Resel, Roland PY - 2011 TI - Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study JF - Journal of Applied Physics VL - 110 IS - 11 PB - American Institute of Physics SN - 00218979 ER -
NEUHOLD, Alfred; Stefanie FLADISCHER; Stefan MITSCHE; Heinz-Georg FLESCH; Armin MOSER; Jiří NOVÁK; Detlef M SMILGIES; Elke KRAKER; Bernhard LAMPRECHT; Anja HAASE; Werner GROGGER a Roland RESEL. Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study. \textit{Journal of Applied Physics}. Melville, USA: American Institute of Physics, 2011, roč.~110, č.~11, 7 s. ISSN~0021-8979. Dostupné z: https://doi.org/10.1063/1.3667171.