| ŠŤASTNÝ, Jiří, Petr SLÁDEK a Pavel SŤAHEL. Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys. In Proceedings of Contributed Papers, konference WDS 97 Praha. Praha: UK, Matematicko-fyzikální fakulta, 1997, s. 388. |
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@inbook{194425,
author = {Šťastný, Jiří and Sládek, Petr and Sťahel, Pavel},
address = {Praha},
booktitle = {Proceedings of Contributed Papers, konference WDS 97 Praha},
language = {eng},
location = {Praha},
pages = {388-388},
publisher = {UK, Matematicko-fyzikální fakulta},
title = {Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys},
year = {1997}
}
TY - CHAP
ID - 194425
AU - Šťastný, Jiří - Sládek, Petr - Sťahel, Pavel
PY - 1997
TI - Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys
PB - UK, Matematicko-fyzikální fakulta
CY - Praha
ER -
ŠŤASTNÝ, Jiří, Petr SLÁDEK a Pavel SŤAHEL. Microhardness measurements of the thin layers of the amorphous hydrogenated silicon and its alloys. In \textit{Proceedings of Contributed Papers, konference WDS 97 Praha}. Praha: UK, Matematicko-fyzikální fakulta, 1997, s.~388.
|
