| ROBAUT, F., Petr MIKULÍK, N. CHERIEF, O.F.K. MC GRATH, D. GIVORD, T. BAUMBACH a J.Y. VEUILLEN. Epitaxial growth and characterization of Y2Co17(0001) thin films deposited on W(110). J. Appl. Phys. USA: American Institute of Physics, 1995, roč. 78, s. 997-1003. ISSN 0021-8979. |
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@article{205352,
author = {Robaut, F. and Mikulík, Petr and Cherief, N. and Mc Grath, O.F.K. and Givord, D. and Baumbach, T. and Veuillen, J.Y.},
article_location = {USA},
keywords = {epitaxy; epitaxial growth; x-ray characterization; laser ablation},
language = {eng},
issn = {0021-8979},
journal = {J. Appl. Phys.},
title = {Epitaxial growth and characterization of Y2Co17(0001) thin films deposited on W(110)},
url = {http://www.sci.muni.cz/~mikulik/Publications.html#Y2Co17},
volume = {78},
year = {1995}
}
TY - JOUR
ID - 205352
AU - Robaut, F. - Mikulík, Petr - Cherief, N. - Mc Grath, O.F.K. - Givord, D. - Baumbach, T. - Veuillen, J.Y.
PY - 1995
TI - Epitaxial growth and characterization of Y2Co17(0001) thin films deposited on W(110)
JF - J. Appl. Phys.
VL - 78
SP - 997
EP - 997
PB - American Institute of Physics
SN - 00218979
KW - epitaxy
KW - epitaxial growth
KW - x-ray characterization
KW - laser ablation
UR - http://www.sci.muni.cz/~mikulik/Publications.html#Y2Co17
N2 - The paper deals with epitaxial growth and characterization of Y2Co17(0001) thin films deposited on W(110).
ER -
ROBAUT, F., Petr MIKULÍK, N. CHERIEF, O.F.K. MC GRATH, D. GIVORD, T. BAUMBACH a J.Y. VEUILLEN. Epitaxial growth and characterization of Y$<$sub$>$2$<$/sub$>$Co$<$sub$>$17$<$/sub$>$(0001) thin films deposited on W(110). \textit{J. Appl. Phys.}. USA: American Institute of Physics, 1995, roč.~78, s.~997-1003. ISSN~0021-8979.
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