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@inproceedings{205657,
author = {Hamma, S. and Sťahel, Pavel and Rocca, C.P.},
address = {Wien},
booktitle = {2nd WCEPSE},
edition = {1.},
keywords = {p-(ľcSi:H) layers; pin solar cells; ellipsometry; Kelvin probe},
language = {eng},
location = {Wien},
pages = {10-13},
publisher = {University of Wien},
title = {Optimum crystalline fraction in p-(ľcSi:H) layers for pin solar cells: in-situ study by ellipsometry and Kelvin probe},
year = {1998}
}
TY - JOUR
ID - 205657
AU - Hamma, S. - Sťahel, Pavel - Rocca, C.P.
PY - 1998
TI - Optimum crystalline fraction in p-(ľcSi:H) layers for pin solar cells: in-situ study by ellipsometry and Kelvin probe
PB - University of Wien
CY - Wien
KW - p-(ľcSi:H) layers
KW - pin solar cells
KW - ellipsometry
KW - Kelvin probe
ER -
HAMMA, S., Pavel SŤAHEL a C.P. ROCCA. Optimum crystalline fraction in p-(ľcSi:H) layers for pin solar cells: in-situ study by ellipsometry and Kelvin probe. In \textit{2nd WCEPSE}. 1. vyd. Wien: University of Wien, 1998, s.~10-13.
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