Výpis publikací

WANG, Chennan; Ondřej CAHA; Filip MÜNZ; Petr KOSTELNÍK; Tomáš NOVÁK a Josef HUMLÍČEK. Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures. Applied Surface Science. Amsterdam: Elsevier Science, 2017, roč. 421, November, s. 859-865. ISSN 0169-4332. Dostupné z: https://doi.org/10.1016/j.apsusc.2017.02.056.

BARTÁKOVÁ, Sonia; Patrik PRACHÁR; Stanislav HASOŇ; Raimo SILVENNOINEN; Ladislav CVRČEK; Luděk STRAŠÁK; Lukáš FOJT; Antonis AVRANAS a Vladimír VETTERL. Biofyzikální mechanismy určující biokompatibilitu dentálních implantátů a podmiňující jejich oseointegraci. Česká Stomatologie. Praha: ČLS JEP, 2009, roč. 109, č. 3, s. 48-53. ISSN 1213-0613.

NEČAS, David; Lenka ZAJÍČKOVÁ; Daniel FRANTA; Pavel SŤAHEL; Petr MIKULÍK; Mojmír MEDUŇA a Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, roč. 7, březen, s. 486-490. ISSN 1348-0391.

OHLÍDAL, Ivan a David NEČAS. Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films. Journal of modern optics. Londýn: Taylor & Francis Ltd., 2008, roč. 55, č. 7, s. 1077-1099. ISSN 0950-0340.

MARŠÍK, Přemysl a Josef HUMLÍČEK. Multiplate misalignment artifacts in rotating-complensator ellipsometry: Analysis and data treatment. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1064-1067. ISSN 1610-1634.

MARŠÍK, Přemysl a Mikhail BAKLANOV. Optical characteristics and UV modification of low-k materials. In 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. Beijing: IEEE, 2008, s. 765-768. ISBN 978-1-4244-2185-5.

NEČAS, David; Vratislav PEŘINA; Daniel FRANTA; Ivan OHLÍDAL a Josef ZEMEK. Optical characterization of non-stoichiometric silicon nitride films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1320-1323. ISSN 1610-1634.

ESLAVA, Salvador; Guillaume EYMERY; Přemysl MARŠÍK; Francesca IACOPI; Christine KIRSCHHOCK; Karen MAEX; Johan MARTENS a Mikhail BAKLANOV. Optical Property Changes in Low-k Films upon Ultraviolet-Assisted Curing. Journal of the electrochemical society. New York: The Electrochemical Society, 2008, roč. 155, č. 5, s. G115-G120, 6 s. ISSN 0013-4651.

FRANTA, Daniel; Ivan OHLÍDAL a David NEČAS. Optical quantities of rough films calculated by Rayleigh-Rice theory. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1395–1398. ISSN 1610-1634.

MARŠÍK, Přemysl; Patrick VERDONCK; Dieter SCHNEIDER; David DE ROEST; Shinya KANEKO a Mikhail BAKLANOV. Spectroscopic elipsometry and ellipsometric porosimetry studies of CVD low-k dielectric films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1253-1256. ISSN 1610-1634.

OHLÍDAL, Ivan; David NEČAS a Daniel FRANTA. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1399–1402. ISSN 1610-1634.

HUMLÍČEK, Josef; Adam DUBROKA; Přemysl MARŠÍK; Dominik MUNZAR; A.V. BORIS a Christian BERNHARD. Frequency- and temperature-dependent conductivity at the metal-insulator transition in phosphorus doped silicon studied by far-infrared ellipsometry. In CP893, Physics of Semiconductors, 28th International Conference. USA: American Institute of Physics, 2007, s. 33-34. ISBN 978-0-7354-0397-0.

OHLÍDAL, Ivan; Daniel FRANTA; Martin ŠILER; František VIŽĎA; Miloslav FRUMAR; Jaroslav JEDELSKÝ a Jaroslav OMASTA. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films. Journal of Non-Crystalline Solids. NORTH-HOLLAND, 2006, roč. 352, 52-54, s. 5633-5641, 8 s. ISSN 0022-3093.

FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK; Růžena NEPUSTILOVÁ a Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2006, roč. 38, č. 4, s. 842-846. ISSN 0142-2421.

FRANTA, Daniel a Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2006, roč. 8, č. 9, s. 763-774. ISSN 1464-4258.

VALTR, Miroslav; Ivan OHLÍDAL a Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys. Praha: Institute of Physics Academy of Sciences, 2006, roč. 56/2006, Suppl. B, s. 1103 - 1109. ISSN 0011-4626.

OHLÍDAL, Ivan; Daniel FRANTA a Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, roč. 55, č. 3, s. 271-294. ISSN 0323-0465.

FRANTA, Daniel a Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications. Amsterdam: Elsevier Science, 2005, roč. 248, č. 1, s. 459-467. ISSN 0030-4018.

OHLÍDAL, Ivan; Daniel FRANTA a Petr KLAPETEK. Ellipsometry in characterization of thin films. In Proceedings of the SREN 2005. Bratislava, Slovakia: Comenius University, 2005, s. 81-111. ISBN 80-223-2099-4.

JAN, Mistrík; Ivan OHLÍDAL; Roman ANTOŠ; Mitsuru AOYAMA a Tomuo YAMAGUCHI. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 51-54. ISSN 0169-4332.

FRANTA, Daniel a Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, s. 59632H-1-59632H-12, 12 s. ISBN 0-8194-5981-X.

PŘIKRYL, Radek; Ladislav ČECH; Lenka ZAJÍČKOVÁ; Jan VANĚK; S. BEHZADI a F.R. JONES. Mechanical and optical properties of plasma-polymerized vinyltriethoxysilane. Surface & coatings technology. Elsevier Science, 2005, roč. 200, 1-4, s. 468-471. ISSN 0257-8972.

ŠILER, Martin; Ivan OHLÍDAL; Daniel FRANTA; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics. London, UK: Taylor and Francis, LtD, 2005, roč. 52, č. 4, s. 583-602. ISSN 0950-0340.

FRANTA, Daniel; Ivan OHLÍDAL; Jan MISTÍK; Tomuo YAMAGUCHI; Gu Jin HU a Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 338-342. ISSN 0169-4332.

FRANTA, Daniel; Ivan OHLÍDAL a David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum. USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 159-162. ISSN 0042-207X.

FRANTA, Daniel; Beatrice NEGULESCU; Luc THOMAS; Pierre Richard DAHOO; Marcel GUYOT; Ivan OHLÍDAL; Jan MISTRÍK a Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 426-430. ISSN 0169-4332.

MISTRÍK, Jan; Tomuo YAMAGUCHI; Daniel FRANTA; Ivan OHLÍDAL; Gu Jin HU a Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 431-434. ISSN 0169-4332.

HUMLÍČEK, Josef. Polarized light and ellipsometry. In Handbook of Ellipsometry. New York: William Andrew Publishing, 2005, s. 3-91. Handbook of Ellipsometry. ISBN 0-8155-1499-9.

ANTOŠ, Roman; Jaromír PIŠTORA; Ivan OHLÍDAL; Kamil POSTAVA; Jan MISTRÍK; Tomuo YAMAGUCHI a Štefan VIŠŇOVSKÝ. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate. Journal of Applied Physics. USA: American Institute of Physics, 2005, roč. 97, č. 5, s. 053107-1-053107-7, 7 s. ISSN 0021-8979.

BERNHARD, Christian; Todd HOLDEN; Alexandr BORIS; Natalia KOVALEVA; Alexei PIMENOV a Josef HUMLÍČEK. Anomalous oxygen-isotope effect on the in-plane far-infrared conductivity of detwinned (YBa2Cu3O6.9)-O-16,18. Physical Review B. USA: The American Physical Society, 2004, roč. 69, č. 5, s. 2502-4, 4 s. ISSN 0163-1829.

FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK a Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 399-403. ISSN 0040-6090.

OHLÍDAL, Ivan; Daniel FRANTA; Miroslav FRUMAR; Jaroslav JEDELSKÝ a Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2004, roč. 6, č. 1, s. 139-148. ISSN 1454-4164.

FRANTA, Daniel; Ivan OHLÍDAL; Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 393-398. ISSN 0040-6090.

FRANTA, Daniel; Lenka ZAJÍČKOVÁ; Vilma BURŠÍKOVÁ a Ivan OHLÍDAL. New Dispersion Model of the Optical Constants of the DLC Films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 5, s. 373-384. ISSN 0323-0465.

FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER. Optical characterization of ZnSe thin films. In 19th Congress of the International Commission for Optics: Optics for the Quality of Life. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2003, s. 831-832. ISBN 0-8194-4596-7.

FRANTA, Daniel; Ivan OHLÍDAL; Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical properties of diamond-like carbon films containing SiOx. Diamond and Related Materials. Amsterdam: Elsevier, 2003, roč. 12, č. 9, s. 1532-1538. ISSN 0925-9635.

FRANTA, Daniel; Lenka ZAJÍČKOVÁ; Ivan OHLÍDAL; Jan JANČA a Kateřina VELTRUSKÁ. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry. Diamond and Related Materials. Amsterdam: Elsevier, 2002, roč. 11, č. 1, s. 105-117. ISSN 0925-9635.

FRANTA, Daniel; Lenka ZAJÍČKOVÁ; Ivan OHLÍDAL a Jan JANČA. Optical Characterization of Diamond-like Carbon Films. Vacuum. USA: ELSEVIER (PERGAMON), 2001, roč. 61, 2-4, s. 279-283. ISSN 0042-207X.

FRANTA, Daniel; Ivan OHLÍDAL; Miloslav FRUMAR a Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2001, roč. 175-176, č. 1, s. 555-561. ISSN 0169-4332.

BRZOBOHATÝ, Oto; Lenka ZAJÍČKOVÁ a Vilma BURŠÍKOVÁ. Optical Properties of Si Incorporated Diamond-like Carbon Films Deposited by RF PECVD. In JUNIORMAT 01. 1. vyd. Brno: ÚMI VUT FSI v Brně ve spolupráci s Českou společností pro nové materiály a technologie, 2001, s. 144-145. ISBN 80-214-1885-0.

ZAJÍČKOVÁ, Lenka; Kateřina VELTRUSKÁ; Nataliya TSUD a Daniel FRANTA. XPS and Ellipsometric Study of DLC/Silicon Interface. Vacuum. USA: ELSEVIER (PERGAMON), 2001, roč. 61, 2-4, s. 269-273. ISSN 0042-207X.

ELIÁŠ, Marek; Lenka ZAJÍČKOVÁ; Vilma BURŠÍKOVÁ; Jan JANČA a Michal LORENC. Deposition of nanocomposite CNx/SiO films in inductively coupled r.f. discharge. Diamond and Related Materials. New York: Elsevier Science S.A., 2000, roč. 9, č. 7, s. 552-555. ISSN 0925-9635.

PAVELKA, Radek; Ivan OHLÍDAL; Jan HLÁVKA; Daniel FRANTA a Helmut SITTER. Optical characterization of thin films with randomly rough boundaries using the photovoltage method. Thin Solid Films. UK Oxford: Elsevier science, 2000, roč. 366, č. 1, s. 43-50. ISSN 0040-6090.

LORENC, Michal; Jan ŠIK; Alois NEBOJSA; Karel NAVRÁTIL; Josef HUMLÍČEK; V. VORLIČEK a E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague: Institute of Physics ASCR, CR, 1999, s. 369-372. ISBN 80-238-3551-3.

HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films. UK Oxford: Elsevier science, 1998, roč. 1998, 313-314, s. 656-660. ISSN 0040-6090.

HUMLÍČEK, Josef; Alois NEBOJSA; J. HORA; M. STRÁSKÝ; J. SPOUSTA a T. ŠIKOLA. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films. UK Oxford: Elsevier science, 1998, roč. 1998, č. 332, s. 25-29. ISSN 0040-6090.

HUMLÍČEK, Josef. Infrared ellipsometry of LiF. Thin Solid Films. UK Oxford: Elsevier science, 1998, roč. 1998, 313-314, s. 687-691. ISSN 0040-6090.

HAMMA, S.; Pavel SŤAHEL a C.P. ROCCA. Optimum crystalline fraction in p-(ľcSi:H) layers for pin solar cells: in-situ study by ellipsometry and Kelvin probe. In 2nd WCEPSE. 1. vyd. Wien: University of Wien, 1998, s. 10-13.

BORTCHAGOVSKY, E.; I. YURCHENKO; Z. KAZANTSEVA; Josef HUMLÍČEK a J. HORA. Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation. Thin Solid Films. UK Oxford: Elsevier science, 1998, roč. 1998, 313-314, s. 795-798. ISSN 0040-6090.

ROCCA, C.P.; Pavel SŤAHEL a S. HAMMA. Stable single junction P-I-N solar cells with efficiencies approaching 10%. In 2nd WCEPSE. 1. vyd. Wien: University of Wien, 1998, s. 32-35.