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@article{200253,
author = {Humlíček, Josef},
article_location = {UK Oxford},
article_number = {313-314},
keywords = {ellipsometry},
language = {eng},
issn = {0040-6090},
journal = {Thin Solid Films},
title = {Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys},
volume = {1998},
year = {1998}
}
TY - JOUR
ID - 200253
AU - Humlíček, Josef
PY - 1998
TI - Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys
JF - Thin Solid Films
VL - 1998
IS - 313-314
SP - 656
EP - 656
PB - Elsevier science
SN - 00406090
KW - ellipsometry
ER -
HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. \textit{Thin Solid Films}. UK Oxford: Elsevier science, 1998, roč.~1998, 313-314, s.~656-660. ISSN~0040-6090.
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