| LORENC, Michal, Jan ŠIK, Alois NEBOJSA, Karel NAVRÁTIL, Josef HUMLÍČEK, V. VORLIČEK a E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague: Institute of Physics ASCR, CR, 1999, s. 369-372. ISBN 80-238-3551-3. |
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@inproceedings{204851,
author = {Lorenc, Michal and Šik, Jan and Nebojsa, Alois and Navrátil, Karel and Humlíček, Josef and Vorliček, V. and Hulicius, E.},
address = {Prague},
booktitle = {Workshop proceedings EW MOVPE VIII},
keywords = {MOVPE; InSb; ellipsometry; reflectance; Raman; annealing},
language = {eng},
location = {Prague},
isbn = {80-238-3551-3},
pages = {369-372},
publisher = {Institute of Physics ASCR, CR},
title = {Optical characterisation of a thick MOVPE InSb film on GaAs},
year = {1999}
}
TY - JOUR
ID - 204851
AU - Lorenc, Michal - Šik, Jan - Nebojsa, Alois - Navrátil, Karel - Humlíček, Josef - Vorliček, V. - Hulicius, E.
PY - 1999
TI - Optical characterisation of a thick MOVPE InSb film on GaAs
PB - Institute of Physics ASCR, CR
CY - Prague
SN - 8023835513
KW - MOVPE
KW - InSb
KW - ellipsometry
KW - reflectance
KW - Raman
KW - annealing
N2 - Optical characterisation of a thick MOVPE InSb film on GaAs
ER -
LORENC, Michal, Jan ŠIK, Alois NEBOJSA, Karel NAVRÁTIL, Josef HUMLÍČEK, V. VORLIČEK a E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In \textit{Workshop proceedings EW MOVPE VIII}. Prague: Institute of Physics ASCR, CR, 1999, s.~369-372. ISBN~80-238-3551-3.
|
