| OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, s. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3. |
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@inproceedings{207572,
author = {Ohlídal, Ivan},
address = {Bellingham, Washington, USA},
booktitle = {11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics},
keywords = {Optical methods; Solid surfaces Thin films},
language = {eng},
location = {Bellingham, Washington, USA},
isbn = {0-8194-3306-3},
pages = {429-440},
publisher = {SPIE - The International Society for Optical Engineering},
title = {Optical methods for surface characterization},
year = {1999}
}
TY - JOUR
ID - 207572
AU - Ohlídal, Ivan
PY - 1999
TI - Optical methods for surface characterization
VL - SPIE Proceeding Series, Volume 3820
PB - SPIE - The International Society for Optical Engineering
CY - Bellingham, Washington, USA
SN - 0819433063
KW - Optical methods
KW - Solid surfaces Thin films
N2 - In this review paper a survey of the most significant optical methods usable for characterizing solid surfaces is performed. Examples allowing to show practical features of applying these methods at investigatinthe surfaces mentioned are presented too. By means of these examples both a reliability and accuracy of the methods are namely demonstrated.
ER -
OHLÍDAL, Ivan. Optical methods for surface characterization. In \textit{11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics}. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, s.~429-440. SPIE Proceeding Series, Volume 3820. ISBN~0-8194-3306-3.
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