Filtrování

    2008

    1. E-learning - optické analytické metody
      JANČÁŘ, Luděk a Lucie SICHOVÁ. E-learning - optické analytické metody. In Acta Fac. Paed. Univ. Tyrnaviensis, Ser. D., Supplementum 2, No. 12. Trnava, 2008, s. 267-270. ISBN 978-80-8082-182-1.
      Podrobněji: https://is.muni.cz/publication/806859/cs

    2003

    1. Atomic force microscopy characterization of ZnTe epitaxial films
      KLAPETEK, Petr; Ivan OHLÍDAL; Daniel FRANTA; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 3, s. 223-230. ISSN 0323-0465.
      Podrobněji: https://is.muni.cz/publication/489711/cs

    2002

    1. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
      KLAPETEK, Petr; Ivan OHLÍDAL; Daniel FRANTA a Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 559-564. ISSN 0142-2421.
      Podrobněji: https://is.muni.cz/publication/404727/cs

    1999

    1. Optical methods for surface characterization
      OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, s. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3.
      Podrobněji: https://is.muni.cz/publication/207572/cs
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