Atomic force microscopy characterization of ZnTe epitaxial
films

J 2003

Atomic force microscopy characterization of ZnTe epitaxial films

KLAPETEK, Petr; Ivan OHLÍDAL; Daniel FRANTA; Alberto MONTAIGNE-RAMIL; Alberta BONANNI et al.

Základní údaje

Originální název

Atomic force microscopy characterization of ZnTe epitaxial films

Autoři

KLAPETEK, Petr; Ivan OHLÍDAL; Daniel FRANTA; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER

Vydání

Acta Physica Slovaca, Bratislava, Institute of Physics, SAS, 2003, 0323-0465

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10302 Condensed matter physics

Stát vydavatele

Slovensko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 0.579

Označené pro přenos do RIV

Ano

Kód RIV

RIV/00216224:14310/03:00009017

Organizační jednotka

Přírodovědecká fakulta

UT WoS

000183309100005

Klíčová slova anglicky

OPTICAL METHODS; THIN-FILMS; GOLD

Štítky

gold, optical methods, THIN-FILMS

Změněno: 25. 12. 2003 01:17, Mgr. Daniel Franta, Ph.D.

Anotace

V originále

In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.

Návaznosti

MSM 143100003, záměr

Název: Studium plazmochemických reakcí v neizotermickém nízkoteplotním plazmatu a jeho interakcí s povrchem pevných látek

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, Studium plazmochemických reakcí v neizotermickém nízkoteplotním plazmatu a jeho interakcí s povrchem pevných látek

Citovat

KLAPETEK, Petr; Ivan OHLÍDAL; Daniel FRANTA; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 3, s. 223-230. ISSN 0323-0465.

@article{489711,
   author = {Klapetek, Petr and Ohlídal, Ivan and Franta, Daniel and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut},
   article_location = {Bratislava},
   article_number = {3},
   keywords = {OPTICAL METHODS; THIN-FILMS; GOLD},
   language = {eng},
   issn = {0323-0465},
   journal = {Acta Physica Slovaca},
   title = {Atomic force microscopy characterization of ZnTe epitaxial films},
   url = {http://hydra.physics.muni.cz/~franta/bib/APS53_223.html},
   volume = {53},
   year = {2003}
}

TY  - JOUR
ID  - 489711
AU  - Klapetek, Petr - Ohlídal, Ivan - Franta, Daniel - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut
PY  - 2003
TI  - Atomic force microscopy characterization of ZnTe epitaxial films
JF  - Acta Physica Slovaca
VL  - 53
IS  - 3
SP  - 223-230
EP  - 223-230
PB  - Institute of Physics, SAS
SN  - 03230465
KW  - OPTICAL METHODS
KW  - THIN-FILMS
KW  - GOLD
UR  - http://hydra.physics.muni.cz/~franta/bib/APS53_223.html
N2  - In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.
ER  -

KLAPETEK, Petr; Ivan OHLÍDAL; Daniel FRANTA; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. \textit{Acta Physica Slovaca}. Bratislava: Institute of Physics, SAS, 2003, roč.~53, č.~3, s.~223-230. ISSN~0323-0465.

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