| OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, roč. 3, č. 4, s. 873-878. ISSN 1454-4164. |
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@article{387372,
author = {Ohlídal, Ivan and Franta, Daniel and Frumar, Miroslav and Jedelský, Jaroslav and Navrátil, Karel},
article_location = {Bucharest},
article_number = {4},
keywords = {As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants},
language = {eng},
issn = {1454-4164},
journal = {Journal of Optoelectronics and Advanced Materials},
title = {Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method},
url = {http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html},
volume = {3},
year = {2001}
}
TY - JOUR
ID - 387372
AU - Ohlídal, Ivan - Franta, Daniel - Frumar, Miroslav - Jedelský, Jaroslav - Navrátil, Karel
PY - 2001
TI - Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
JF - Journal of Optoelectronics and Advanced Materials
VL - 3
IS - 4
SP - 873
EP - 873
PB - INOE & INFM
SN - 14544164
KW - As-S chalcogenide films
KW - Combined spectrophotometric method
KW - Amorphous materials
KW - Optical constants
UR - http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html
N2 - In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.
ER -
OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. \textit{Journal of Optoelectronics and Advanced Materials}. Bucharest: INOE \&{} INFM, 2001, roč.~3, č.~4, s.~873-878. ISSN~1454-4164.
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