Výpis publikací

OHLÍDAL, Ivan; David NEČAS; Daniel FRANTA a Vilma BURŠÍKOVÁ. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, roč. 18, 2-3, s. 364-367. ISSN 0925-9635. Dostupné z: https://doi.org/10.1016/j.diamond.2008.09.003.

OHLÍDAL, Ivan; David NEČAS; Vilma BURŠÍKOVÁ; Daniel FRANTA a Miloslav OHLÍDAL. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry. Diamond and Related Materials. New York: Elsevier, 2008, roč. 17, č. 1, s. 709–712. ISSN 0925-9635.

NEČAS, David; Vratislav PEŘINA; Daniel FRANTA; Ivan OHLÍDAL a Josef ZEMEK. Optical characterization of non-stoichiometric silicon nitride films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1320-1323. ISSN 1610-1634.

FRANTA, Daniel; Martin HRDLIČKA; David NEČAS; Miloslav FRUMAR; Ivan OHLÍDAL a Martin PAVLIŠTA. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1324-1327. ISSN 1610-1634.

FRANTA, Daniel; Vilma BURŠÍKOVÁ; Ivan OHLÍDAL; Pavel SŤAHEL; Miloslav OHLÍDAL a David NEČAS. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films. Diamond and Related Materials. New York: Elsevier, 2007, roč. 16, 4-7, s. 1331–1335. ISSN 0925-9635.

ZAJÍČKOVÁ, Lenka; Monika KARÁSKOVÁ; Ondřej JAŠEK; Vilma BURŠÍKOVÁ; Daniel FRANTA; Jiřina MATĚJKOVÁ a Petr KLAPETEK. Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films. In New Perspectives of Plasma Science and Technology CD. 1. vyd. Brno: VUT Brno, 2007, 1 s.

FRANTA, Daniel; David NEČAS a Lenka ZAJÍČKOVÁ. Models of dielectric response in disordered solids. Optics Express. elektronicky: Optical Society of America, 2007, roč. 15, č. 24, s. 16230-16244. ISSN 1094-4087.

FRANTA, Daniel; Ivan OHLÍDAL; Jan MISTÍK; Tomuo YAMAGUCHI; Gu Jin HU a Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 338-342. ISSN 0169-4332.

FRANTA, Daniel; Ivan OHLÍDAL a David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum. USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 159-162. ISSN 0042-207X.

FRANTA, Daniel; Beatrice NEGULESCU; Luc THOMAS; Pierre Richard DAHOO; Marcel GUYOT; Ivan OHLÍDAL; Jan MISTRÍK a Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 426-430. ISSN 0169-4332.

MISTRÍK, Jan; Tomuo YAMAGUCHI; Daniel FRANTA; Ivan OHLÍDAL; Gu Jin HU a Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 431-434. ISSN 0169-4332.

OHLÍDAL, Ivan; Daniel FRANTA; Miroslav FRUMAR; Jaroslav JEDELSKÝ a Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2004, roč. 6, č. 1, s. 139-148. ISSN 1454-4164.

FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER. Optical characterization of ZnSe thin films. In 19th Congress of the International Commission for Optics: Optics for the Quality of Life. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2003, s. 831-832. ISBN 0-8194-4596-7.

OHLÍDAL, Ivan; Daniel FRANTA; Miroslav FRUMAR; Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, roč. 3, č. 4, s. 873-878. ISSN 1454-4164.

FRANTA, Daniel; Ivan OHLÍDAL; Dominik MUNZAR; Jaroslav HORA; Karel NAVRÁTIL; Claudio MANFREDOTTI; Franco FIZZOTTI a Ettore VITTONE. Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 1999, roč. 343-344, č. 1, s. 295-298. ISSN 0040-6090.