Filtrování

    2007

    1. Laser Ablation Time-of-Flight Mass Spectrometry LA-TOF-MS of Nitrogen Doped Diamond-Like Carbon DLN Nano-Layers
      HAVEL, Josef; Vilma BURŠÍKOVÁ; Pavel ŘEHULKA; Josef CHMELÍK; Milan ALBERTI; Zbyněk ŠPALT a Jan JANČA. Laser Ablation Time-of-Flight Mass Spectrometry LA-TOF-MS of Nitrogen Doped Diamond-Like Carbon DLN Nano-Layers. Journal of Physics and Chemistry of Solids. UK: Elsevier, 2007, roč. 68, 5-6, s. 701 - 706. ISSN 0022-3697.
      Podrobněji: https://is.muni.cz/publication/753690/cs
    2. Selective wet etching of amorphous/crystallized Ag/As/S and Ag/As/S/Se chalcogenide thin films
      ORAVA, Jiří; Tomáš WAGNER; Miloš KRBAL; Tomáš KOHOUTEK; Milan VLČEK; Ludvík BENEŠ; Eva KOTULANOVÁ; Petr BEZDIČKA; Petr KLAPETEK a Miloslav FRUMAR. Selective wet etching of amorphous/crystallized Ag/As/S and Ag/As/S/Se chalcogenide thin films. Journal of Physics and Chemistry of Solids. Elsevier, 2007, roč. 68, 5-6, s. 1008-1013. ISSN 0022-3697.
      Podrobněji: https://is.muni.cz/publication/769953/cs

    2004

    1. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films
      OHLÍDAL, Ivan; Daniel FRANTA; Miroslav FRUMAR; Jaroslav JEDELSKÝ a Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2004, roč. 6, č. 1, s. 139-148. ISSN 1454-4164.
      Podrobněji: https://is.muni.cz/publication/555827/cs
    2. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
      FRANTA, Daniel; Ivan OHLÍDAL; Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 393-398. ISSN 0040-6090.
      Podrobněji: https://is.muni.cz/publication/555829/cs

    2002

    1. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry
      FRANTA, Daniel; Lenka ZAJÍČKOVÁ; Ivan OHLÍDAL; Jan JANČA a Kateřina VELTRUSKÁ. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry. Diamond and Related Materials. Amsterdam: Elsevier, 2002, roč. 11, č. 1, s. 105-117. ISSN 0925-9635.
      Podrobněji: https://is.muni.cz/publication/392491/cs

    2001

    1. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
      OHLÍDAL, Ivan; Daniel FRANTA; Miroslav FRUMAR; Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, roč. 3, č. 4, s. 873-878. ISSN 1454-4164.
      Podrobněji: https://is.muni.cz/publication/387372/cs
    2. Optical Characterization of Diamond-like Carbon Films
      FRANTA, Daniel; Lenka ZAJÍČKOVÁ; Ivan OHLÍDAL a Jan JANČA. Optical Characterization of Diamond-like Carbon Films. Vacuum. USA: ELSEVIER (PERGAMON), 2001, roč. 61, 2-4, s. 279-283. ISSN 0042-207X.
      Podrobněji: https://is.muni.cz/publication/366093/cs
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